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Results 1 - 10 of 33 for Bruker X-Ray Analysis
  • Supplier Profile
    Bruker X-Ray Analysis designs and manufactures analytical X-ray systems for elemental analysis, materials research and structural investigations. Our innovative solutions enable a wide range of...
  • Supplier Profile
    The Bruker name has become synonymous with the excellence, innovation and quality that characterizes our comprehensive range of scientific instrumentation. Bruker's trusted solutions encompass...
  • Supplier Profile
    The companies under Bruker Inc. are globally leading manufacturer of analytical systems for life and materials sciences. The Bruker Nano Analytics (BNA) Division, headquartered at Bruker Nano GmbH in...
  • Video
    Michael Haschke from Bruker AXS shows us thorugh their new range of Micro XRF (X-Ray Fluorescence) instruments. He shows us 3 instruments that vary in chamber size, with the largest able to...
  • News - 1 Sep 2008
    At the 14th European Microscopy Conference opening today, Bruker AXS Microanalysis announced the European launch of several new products and options for Scanning Electron Microscope (SEM)...
  • News - 18 Mar 2011
    By Cameron Chai Bruker is showcasing its range of analytical technologies at Pittcon 2011. The systems target better analysis in industrial and related applications for improved sensitivity and...
  • Video
    This video shows how the X-ray powder diffraction sample preparation, measurement and analysis is now easy with Bruker’s D2 PHASER instrument.
  • Video
    This video shows how the high resolution Bruker D8 Discover X-ray diffractometer is used for thin film analysis.
  • News - 20 Jul 2007
    FEI has announced the availability of an all-new software package known as the microValidator. This unique software is designed to deliver rapid validation of FEI's scanning electron...
  • News - 2 Sep 2009
    FEI Company (Nasdaq:FEIC), a leading provider of high-resolution imaging and analysis systems, today announced the release of two dedicated scanning electron microscopes (SEMs) and a new...