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Results 1 - 4 of 4 for CAPRES A/S.

CAPRES Receives New Order for Automated 300mm microRSP-A Metrology Tool

CAPRES A/S, a Danish developer of next generation semiconductor metrology systems for direct nano- and micro-scale electrical characterization of materials, announced today that it has received a new...

http://www.azonano.com/news.aspx?newsID=19822 | 4 Oct 2010
IDM Selects CAPRES’s microRSP-A300 Automated Metrology System to Streamline Wafer Production

CAPRES A/S, a Danish developer of next generation semiconductor metrology systems for direct nano- and micro-scale electrical characterization of materials, announced today that they have received a...

http://www.azonano.com/news.aspx?newsID=19775 | 30 Sep 2010
Asia's Leading Foundry to Install Automated microRSP-A300 from CAPRES

CAPRES A/S, a Danish developer of next-generation semiconductor metrology systems for the direct nano- and micro-scale electrical characterization of materials, today announced the first shipment of...

http://www.azonano.com/news.aspx?newsID=16625 | 24 Mar 2010
CAPRES A/S

CAPRES A/S develops new technology for direct nano- and micro-scale electrical characterization of materials. CAPRES A/S offer a versatile Microscopic Four- and Twelve Point Probe...

http://www.azonano.com/suppliers.aspx?SupplierID=1987

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