New measurements of key wavelengths of ultraviolet light—down to a few millionths of a nanometer—are among the most precise ever reported and are improving calibrations of microlithography tools used...
http://www.azonano.com/article.aspx?ArticleID=666 | 26 Mar 2004
The AFM has been and still is a powerful tool in basic research and metrology. Height measurement by AFM is crucial in metrology, which however would also benefit from the capability to perform...
http://www.azonano.com/article.aspx?ArticleID=2995 | 26 Mar 2012
Everyone who is involved with nanotechnology knows the price of mistake when their SPM is uncalibrated or improperly calibrated. With the help of NT-MDT test samples and calibration gratings, it's...
http://www.azonano.com/article.aspx?ArticleID=2491 | 29 Dec 2009
By Cameron Chai
Spectrophotometer calibration involves using a calibration standard or filter to verify the precision of the light source. The technique is vital to verify the effective functioning...
http://www.azonano.com/news.aspx?newsID=22318 | 28 Apr 2011
As a response to the increased demand for affordable high-quality AFM calibration standards, BudgetSensors®, a Bulgarian manufacturer of silicon and silicon nitride probes, as well as AFM accessories...
http://www.azonano.com/news.aspx?newsID=6477 | 27 May 2008
Following the introduction of the AFM height calibration standards HS-100MG
and the HS-20MG, BudgetSensors
announces the commercial introduction of third type of AFM height calibration...
http://www.azonano.com/news.aspx?newsID=7020 | 1 Aug 2008
After the initial release of the nano-deposition standards in early December 2010, NSG has been seeing tremendous feedback regarding the accuracy and reliability of these UV/VIS calibration standards....
http://www.azonano.com/news.aspx?newsID=21125 | 6 Jan 2011
Agar Scientific, a leading supplier of microscopy accessories and consumables, provides NIST and NPL traceable Certified Reference Materials from Geller Microanalytical Laboratory.
http://www.azonano.com/news.aspx?newsID=26760 | 5 Mar 2013
By Will Soutter
The University of California, Irvine, has awarded a subcontract to Northrop Grumman to focus on long-term calibration issues of inertial sensors.
Inertial sensors are used for taking...
http://www.azonano.com/news.aspx?newsID=25610 | 25 Sep 2012
Agilent Technologies Inc. (NYSE: A) today introduced the first commercially available capacitance calibration standard for an atomic force microscope (AFM). The scientific solutions provider issued...
http://www.azonano.com/news.aspx?newsID=22964 | 12 Jul 2011