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Results 1 - 10 of 78 for Ellipsometry
  • Supplier Profile
    The J.A. Woollam Company was founded in 1987 by Dr. John A. Woollam. Starting as a spin-off from the University of Nebraska, the J.A. Woollam Company has rapidly grown to become a worldwide...
  • Supplier Profile
    NANOLANE is specialized in optical solutions at nanoscale and commercializes characterization tools based on the label-free patented SEEC (Surface Enhanced Ellipsometry Contrast) optical technique...
  • Supplier Profile
    HORIBA Scientific is the world-leading manufacturer of high performance spectroscopic instrumentation for all applications from R&D to routine analysis. Our instruments are used in...
  • Article - 22 May 2008
    This article describes how the UVISEL Spectroscopic Phase Modulated Ellipsometer from Horiba Jobin Yvon was used to characterize the influence of substrate to growth of Y2O3
  • Supplier Profile
    Accurion is a high-tech company providing advanced instrumentation in the field of surface analysis and active vibration isolation. Under the brand Nanofilm, Accurion offers surface analysis...
  • Supplier Profile
    SENTECH Instruments GmbH develops, manufactures and sells advanced quality instrumentation for Thin Film Metrology (reflectometer, ellipsometer, spectroscopic ellipsometer) and Plasma...
  • News - 8 Dec 2009
    The EU-funded NANOCHARM ('Multifunctional nanomaterials characterisation exploiting ellipsometry and polarimetry') project is organising its third winter school on ellipsometry from 27...
  • Supplier Profile
    KLA-Tencor Corporation is the world's leading supplier of process control and yield management solutions for the semiconductor and related microelectronics industries. The company's comprehensive...
  • Video
    This video shows the interview with Daniel Meyer, Sales Manager at Horiba Instruments Inc. He talks about the various analyses such as elemental analysis, particle characterization, Ellipsometry, SPR...
  • Article - 20 May 2008
    Spectroscopic ellipsometry is an optical measurement technique used to determine thin film thickness and optical constants simply and accurately. This article illustrates the ability of the technique...