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Results 1 - 10 of 68 for Ellipsometry.

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Imaging Ellipsometers From Accurion for Optical Determination of Film Thickness and Optical Properties

Ellipsometry is a well-known non-destructive optical method for determining film thickness and optical properties. Imaging Ellipsometry combines the power of ellipsometry with microscopy and overcomes...

http://www.azonano.com/article.aspx?ArticleID=1982 | 18 Sep 2007
Microcontact Printed Monolayers Inspected with Imaging Ellipsometry and SPM by Accurion

Imaging ellipsometry is cheap, fast, and marker-free detection method on Microarrays. The Imaging Ellipsometer EP3 identifies steps in monolayers much faster and with less effort than a SPM and can...

http://www.azonano.com/article.aspx?ArticleID=1979 | 17 Sep 2007
Determination of the Refractive Index of Y2O3 on Glass and Pre Evaporated Substrates by Spectroscopic Ellipsometry Using Equipment from Horiba Scientific - Thin Film

This article describes how the UVISEL Spectroscopic Phase Modulated Ellipsometer from Horiba Jobin Yvon was used to characterize the influence of substrate to growth of Y2O3

http://www.azonano.com/article.aspx?ArticleID=2170 | 22 May 2008
Brewster Angle Microscopy, Reflection Spectroscopy and Langmuir-Blodgettry Investigation of Ultra Thin Films

This article looks at equipment available from Accurion for thin film investiagation. This includes Brewster Angle Microscopy, Reflection Spectroscopy and Langmuir-Blodgettry for the Investigation of...

http://www.azonano.com/article.aspx?ArticleID=1980 | 18 Sep 2007
EU-Funded NANOCHARM Organizes Third Winter School on Ellipsometry for Nanotechnology

The EU-funded NANOCHARM ('Multifunctional nanomaterials characterisation exploiting ellipsometry and polarimetry') project is organising its third winter school on ellipsometry from 27...

http://www.azonano.com/news.aspx?newsID=15048 | 8 Dec 2009
Imaging Ellipsometry – Principles of Operation for Surface Characterization

Ellipsometry is a well-known non-destructive optical method for measuring film thickness and optical properties. Imaging Ellipsometry combines the power of ellipsometry with microscopy and overcomes...

http://www.azonano.com/article.aspx?ArticleID=2944 | 20 Oct 2011
Latest Spectroscopy Products from Horiba Scientific

This video shows the interview with Daniel Meyer, Sales Manager at Horiba Instruments Inc. He talks about the various analyses such as elemental analysis, particle characterization, Ellipsometry, SPR...

http://www.azonano.com/nanotechnology-video-details.aspx?VidID=927
Optical Modelling Software for Imaging Ellipsometry by Accurion

This is an introduction to Accurion‘s latest version of their modelling software for calculating ellipsometric data, thickness and material specific dispersion parameters.

http://www.azonano.com/nanotechnology-video-details.aspx?VidID=641
Characterization of Photovoltaic Devices by Spectroscopic Ellipsometry Using Equipment from Horiba Scientific - Thin Film

Spectroscopic ellipsometry is an optical measurement technique used to determine thin film thickness and optical constants simply and accurately. This article illustrates the ability of the technique...

http://www.azonano.com/article.aspx?ArticleID=2164 | 20 May 2008
Characterization and Visualization of Polyelectrolyte Multilayers in Dry and Wet Environments

Different polyelectrolytes multilayers are studied by SARFUS 3D IMM system both in dry and in solution. Thickness measurements of the layers are realized and compared to measurements done with...

http://www.azonano.com/article.aspx?ArticleID=2718 | 7 Nov 2010

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