The J.A. Woollam Company was founded in 1987 by Dr. John A. Woollam. Starting
as a spin-off from the University of Nebraska, the J.A. Woollam Company has
rapidly grown to become a worldwide...
NANOLANE is specialized in optical solutions at nanoscale and commercializes characterization tools based on the label-free patented SEEC (Surface Enhanced Ellipsometry Contrast) optical technique...
HORIBA Scientific is the world-leading manufacturer of high performance spectroscopic instrumentation for all applications from R&D to routine analysis. Our instruments are used in...
This article describes how the UVISEL Spectroscopic Phase Modulated Ellipsometer from Horiba Jobin Yvon was used to characterize the influence of substrate to growth of Y2O3
http://www.azonano.com/article.aspx?ArticleID=2170 | 22 May 2008
Accurion is a high-tech company providing advanced instrumentation in the field of surface analysis and active vibration isolation.
Under the brand Nanofilm, Accurion offers surface analysis...
Instruments GmbH develops, manufactures and sells advanced quality instrumentation
for Thin Film Metrology (reflectometer, ellipsometer, spectroscopic ellipsometer)
KLA-Tencor Corporation is the world's leading supplier of process control and yield management solutions for the semiconductor and related microelectronics industries. The company's comprehensive...
The EU-funded NANOCHARM ('Multifunctional nanomaterials characterisation exploiting
ellipsometry and polarimetry') project is organising its third winter school
on ellipsometry from 27...
http://www.azonano.com/news.aspx?newsID=15048 | 8 Dec 2009
This video shows the interview with Daniel Meyer, Sales Manager at Horiba Instruments Inc. He talks about the various analyses such as elemental analysis, particle characterization, Ellipsometry, SPR...
Spectroscopic ellipsometry is an optical measurement technique used to determine thin film thickness and optical constants simply and accurately. This article illustrates the ability of the technique...
http://www.azonano.com/article.aspx?ArticleID=2164 | 20 May 2008