The J.A. Woollam Company was founded in 1987 by Dr. John A. Woollam. Starting
as a spin-off from the University of Nebraska, the J.A. Woollam Company has
rapidly grown to become a worldwide...
NANOLANE is specialized in optical solutions at nanoscale and commercializes characterization tools based on the label-free patented SEEC (Surface Enhanced Ellipsometry Contrast) optical technique...
HORIBA Scientific is the new global team created to better meet customers’ present and future needs by integrating the scientific market expertise and resources of HORIBA.
Horiba Scientific Products...
This article describes how the UVISEL Spectroscopic Phase Modulated Ellipsometer from Horiba Jobin Yvon was used to characterize the influence of substrate to growth of Y2O3
http://www.azonano.com/article.aspx?ArticleID=2170 | 22 May 2008
SOPRA manufactures high precision scientific R+D instruments and industrial
tools for thin film measurements with optical solutions.
Well known for its award winning metrology offer for flat...
Accurion is a high-tech company providing advanced instrumentation in the field of surface analysis and active vibration isolation.
Under the brand Nanofilm, Accurion offers surface analysis...
Instruments GmbH develops, manufactures and sells advanced quality instrumentation
for Thin Film Metrology (reflectometer, ellipsometer, spectroscopic ellipsometer)
The EU-funded NANOCHARM ('Multifunctional nanomaterials characterisation exploiting
ellipsometry and polarimetry') project is organising its third winter school
on ellipsometry from 27...
http://www.azonano.com/news.aspx?newsID=15048 | 8 Dec 2009
KLA-Tencor Corporation is the world's leading supplier of process control and yield management solutions for the semiconductor and related microelectronics industries. The company's comprehensive...
This video shows the interview with Daniel Meyer, Sales Manager at Horiba Instruments Inc. He talks about the various analyses such as elemental analysis, particle characterization, Ellipsometry, SPR...