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Results 11 - 20 of 81 for Ellipsometry
  • Oxford Instruments plc
    Supplier Profile
    Oxford Instruments designs, supplies and supports high-technology tools, processes and solutions with a focus on physical science, bioscience, environmental and industrial research and applications....
  • PI (Physik Instrumente) LP
    Supplier Profile
    PI is a privately held company that designs and manufactures world-class precision motion and automation systems including air bearings, hexapods, and piezo drives at locations in North America,...
  • Hiden Analytical
    Supplier Profile
    2022 marks Hiden Analytical’s 40th year of continuous and independent operation in the field of mass spectrometry.  Driven by customer and application focussed innovation, a unique and...
  • NANOLANE
    Supplier Profile
    NANOLANE is specialized in optical solutions at nanoscale and commercializes characterization tools based on the label-free patented SEEC (Surface Enhanced Ellipsometry Contrast) optical technique...
  • CEA-Leti
    Supplier Profile
    Leti is an institute of CEA, a French research-and-technology organization with activities in energy, IT, healthcare, defence and security. Leti is focused on creating value and innovation through...
  • AFM, STM and Ellipsometry Characterization of a Monolayer of Azurin Molecules Self-Assembled on a Gold Surface in Air
    Article - 6 May 2005
    The use of techniques such as Atomic Force Microscopy, Scanning Tunnelling Micrscopy and Ellipsometry have allowed the characterization of azurin molecules in air self-assembled on gold. Evidence also...
  • Spectroscopic Ellipsometer - SE-2000
    Equipment
    This page details information about the SE-2000, a spectroscopic ellipsometer with rotating compensator optics.
  • J.A. Woollam M-2000-Series Spectroscopic Ellipsometers
    Equipment
    The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition make...
  • Events Drawing World's Leading Scientists, Researchers and Engineers to CNSE's Albany NanoTech Complex
    News - 19 May 2010
    The College of Nanoscale Science and Engineering ("CNSE") of the University at Albany has been selected to host five prestigious global conferences dedicated to leading-edge nanoscale...
  • Characterization of Thin Film Transistors
    Article - 26 May 2008
    Spectroscopic ellipsometry characterizes TFT-LCD panels, assessing a-Si and LTPS layer thickness, optical constants, and p-Si grain size with high accuracy.

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