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Results 41 - 50 of 274 for FIB
  • Zyvex Announces F100 Nanomanipulator for Focused Ion Beam Instruments - New Product
    Article - 19 Nov 2003
    Zyvex Corporation, a leading nanotechnology company commercializing innovative tools, products and services, has released the F100 Nanomanipulator System. Posted October 9 2003
  • Bruker Nano Surfaces and Metrology
    Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • Orsay Physics
    Supplier Profile
    Orsay Physics was founded in 1989 by researchers, engineers and specialists in charged particle optics from Paris-Orsay University and started to develop Focused Ion Beam (FIB) columns and...
  • Hitachi High-Tech Europe
    Supplier Profile
    As one of the world’s leading corporations developing solutions in energy, life science and electronics nobody is better placed than Hitachi to appreciate the need to observe micro and nano...
  • Using the ZEISS Crossbeam Laser for Site-specific Laser Work
    Article - 22 Jun 2023
    This article from Carl Zeiss explains how the ZEISS Crossbeam laser is used for site-specific laser work.
  • Semilab Semiconductor Physics Laboratory
    Supplier Profile
    Semilab Semiconductor Physics Laboratory designs, produces and sells metrology equipment for the characterization of semiconductor and photovoltaic materials, for monitoring the manufacturing process...
  • Ted Pella, Inc.
    Supplier Profile
    Ted Pella, Inc. is a manufacturer and distributor of high quality consumables, supplies and specimen preparation tools for all disciplines in science and industry, including: Nanoparticles, either...
  • AURIGA Compact FIB-SEM by Carl Zeiss
    Video
    This video shows the high-tech AURIGA Compact FIB-SEM. Users can leverage the Carl Zeiss CrossBeam technology and blend high resolution imaging with the milling performance of the focused ion beam.
  • inSEM Mechanical Properties Measurement for SEM and FIB/SEM - Nanomechanics - MRS2012
    Video
    Warren Oliver, President of Nanomechanics, gives AZoTV an introduction to Nanomechanics and their inSEM mechanical properties measurement tool at MRS Fall 2012 in Boston.
  • Total Release Method for FIB Lift-Out from Omniprobe
    Video
    The Total Release method for FIB lift-out from Omniprobe has many distinct features for high-throughput TEM sample preparation. This method needs a minimal ion milling for sample excise and transports...

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