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In-situ Integrated Circuit (IC) Characterisation With The Nano Hardness Tester (NHT) From CSM Instruments

The Nano Hardness Tester (NHT) has a combination of high positioning accuracy and automated measurement of hardness and elastic modulus at a nanometer scale that make it ideally suited to...

http://www.azonano.com/article.aspx?ArticleID=1798 | 4 Dec 2006
Quality Control Of Integrated Circuit (IC) Bonding Pads With The Nano Hardness Tester (NHT) From CSM Instruments

For this comparative study a selection of four wafers for integrated circuit (IC) bonding pads were chosen from different manufacturers and the Vickers hardness of each measured using the Nano...

http://www.azonano.com/article.aspx?ArticleID=1788 | 28 Nov 2006
Zyvex Announces New IC Probing Application for Semiconductor Yield Improvement - New Product

Zyvex Corporation today announced a breakthrough probing application for integrated circuit (IC) defect analysis. Posted April 2 2004

http://www.azonano.com/article.aspx?ArticleID=735 | 5 Apr 2004
Ultratech Receives Order from Japan's TOK for Broadband Advanced Packaging Tool - News Item

Ultratech, Inc., a leading supplier of photolithography systems used to manufacture semiconductors and nanotechnology devices, today announced that it has received an order from Tokyo Ohka Kogyo Co.,...

http://www.azonano.com/article.aspx?ArticleID=539 | 24 Feb 2004
Ultratech Receives Multiple-System Order From The World's Largest Merchant Gold-Bump Foundry

Ultratech, Inc., a leading supplier of photolithography systems used to manufacture semiconductors and nanotechnology devices, today announced it has received a multiple-system order for 200 mm bump...

http://www.azonano.com/article.aspx?ArticleID=538 | 24 Feb 2004
NASA Use Carbon Nanotubes in Integrated Circuits - News Item

NASA have developed a technology that uses carbon nanotubes to replace copper interconnects in integrated circuits. It could bring about increased computing power and extend the life of the silicon...

http://www.azonano.com/article.aspx?ArticleID=15 | 2 Oct 2003
Defect Inspection and Analysis Using Atomic Force Microscopy

The Atomic Force Microscope (AFM) employs a system of sensing the extremely small differences between the atomically sharp silicon probe and surface under investigation. This sensitivity is essential...

http://www.azonano.com/article.aspx?ArticleID=1503 | 15 Feb 2006
Textiles and Fabrics Industry - Early Adopters of Nanotechnology Bringing New Materials With Innovative Properties To The General Public - Supplier Data By Nanovic

The textiles industry has been one of the early adopters of nanotechnology products and processes. Branding of nanotechnology in the fabric industry will be important to the introduction of...

http://www.azonano.com/article.aspx?ArticleID=1630 | 11 Jul 2006
Tagging, Monitoring and Tracking Using Nanotechnology Methods and Devices

Radio frequency identification (RFid) tags are increasingly being used in electronic tagging, tracking and monitoring. Applications for RFid tags, benefits and drawbacks of using RFid tags, and...

http://www.azonano.com/article.aspx?ArticleID=1344 | 11 Aug 2005
Nanoelectromechanical Systems (NEMS) - Introduction, Application and Challenges of Nanoelectromechanical Systems

NanoElectroMechanical Systems (NEMS) have critical structural elements at or below 100 nm. This distinguishes them from MicroElectroMechancial Systems (MEMS), where the critical structural elements...

http://www.azonano.com/article.aspx?ArticleID=2465 | 13 Dec 2009

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