JEOL is a leading global supplier of scientific instruments used for research and development in the fields of nanotechnology, life sciences, optical communication, forensics, and biotechnology....
A Japanese company, JEOL, have used nanotechnology to develop a small battery with twice the charge storage of a lead-acid battery and a similar capacity to nickel-hydrogen units. Uploaded 9 October...
http://www.azonano.com/article.aspx?ArticleID=24 | 9 Oct 2003
JEOL USA will demonstrate its new JEM-1400Plus, a 120kV Transmission Electron Microscope, at Microscopy & Microanalysis (M&M) 2013 in Indianapolis, Indiana, from August 5-8.
http://www.azonano.com/news.aspx?newsID=27996 | 7 Aug 2013
Reportlinker.com announces that a new market research report is available
in its catalogue.
Microscopes Market report analyzes the worldwide markets for Microscopes
in Millions of...
http://www.azonano.com/news.aspx?newsID=10386 | 13 Mar 2009
JEOL USA, a leading supplier of scientific and industrial instrumentation including electron microscopes, mass spectrometers and nuclear magnetic resonance spectrometers, and headquartered in Peabody,...
http://www.azonano.com/news.aspx?newsID=23474 | 27 Sep 2011
A new e-brochure from JEOL
illustrates the application of an ion beam cross section polisher for SEM sample
preparation of solar panel thin films and kerogen-rich shale samples. The online...
http://www.azonano.com/news.aspx?newsID=11436 | 12 May 2009
Over the years, the global market for microscopes has largely been driven by the increased demand from the industrial and biological sectors.
Developments in areas involving semiconductors, MEMS...
http://www.azonano.com/news.aspx?newsID=21556 | 10 Feb 2011
Technology integration, marking the convergence of information technology
and digital imaging, is expected to change standard laboratories into advanced
research centers. Current innovations...
http://www.azonano.com/news.aspx?newsID=8284 | 23 Oct 2008
A new 200kV Transmission Electron Microscope from JEOL delivers high throughput nano-analysis for process and quality control of mass produced semiconductor and materials samples.
http://www.azonano.com/news.aspx?newsID=22965 | 12 Jul 2011
JEOL offers a whole
new electron microscope experience with the introduction of the InTouch Scope™,
an analytical, low vacuum Scanning Electron Microscope (SEM) featuring integrated...
http://www.azonano.com/news.aspx?newsID=19640 | 22 Sep 2010