The Proceedings of the National Academy of Sciences features a report on how University of Michigan researchers have used a femtosecond pulsed laser to do extraordinarily precise nanoscale machining....
http://www.azonano.com/article.aspx?ArticleID=798 | 25 Apr 2004
The Nova™ NanoLab is a versatile, high-performance DualBeam™ (FIB / SEM) designed to support the high-end lab requirements of the nanotechnology, material science and life science markets.
http://www.azonano.com/article.aspx?ArticleID=1190 | 15 Apr 2005
The successful growth of nanotechnology can only occur if the right tools and instruments are available. Current and future markets, global competition, technical challenges faced by manufacturers,...
http://www.azonano.com/article.aspx?ArticleID=1295 | 7 Jul 2005
Gas chemistries in the Focused Ion Beam (FIB) microscope play an important role in semiconductor metrology and process control. In the FIB in-situ lift-out process, gas-assisted etching speeds the...
http://www.azonano.com/article.aspx?ArticleID=2706 | 14 Oct 2010
The availability of the Focused Ion Beam (FIB) microscope with its excellent imaging resolution, depth of focus and ion milling capability have made it an appealing platform for materials...
http://www.azonano.com/article.aspx?ArticleID=2705 | 13 Oct 2010
The Expida 1285 DualBeam (FIB / SEM) is a fast 3D defect characterization system that provides an accurate picture of your process, leading to increased control and improved yield.
http://www.azonano.com/article.aspx?ArticleID=1193 | 15 Apr 2005
The Strata 400 STEM DualBeam (FIB / SEM) supports analytical laboratories' increasing need for high resolution analytical capabilities as device geometries shrink below 100 nm and new material systems...
http://www.azonano.com/article.aspx?ArticleID=1192 | 15 Apr 2005
Nozomu Mishima, Tsuneo Kurita, and others of the Environmentally Conscious
Design and Manufacturing Group, the Advanced Manufacturing Research Institute,
the National Institute of Advanced...
http://www.azonano.com/news.aspx?newsID=11219 | 30 Apr 2009
By Cameron Chai
University of Cincinnati’s (UC) Micro and Nano Manufacturing Laboratory Director, Murali Sundaram is exploring the possibility of creating a cost -effective nano manufacturing...
http://www.azonano.com/news.aspx?newsID=23684 | 1 Nov 2011
Instruments Inc. (Nasdaq: VECO), a leader in scientific and industrial metrology,
today introduced the NT9080(TM) Surface Metrology System, which combines non-contact
http://www.azonano.com/news.aspx?newsID=15638 | 26 Jan 2010