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Nanoscale Machining With Ultra Fast Laser - New Technology

The Proceedings of the National Academy of Sciences features a report on how University of Michigan researchers have used a femtosecond pulsed laser to do extraordinarily precise nanoscale machining....

http://www.azonano.com/article.aspx?ArticleID=798 | 25 Apr 2004
Field Emission Scanning Electron Microscopy Using The Nova NanoLab, Versatile, High-Performance DualBeam FIB - SEM from FEI Company

The Nova™ NanoLab is a versatile, high-performance DualBeam™ (FIB / SEM) designed to support the high-end lab requirements of the nanotechnology, material science and life science markets.

http://www.azonano.com/article.aspx?ArticleID=1190 | 15 Apr 2005
Instrumentation, Tooling and Metrology - Markets, Challenges, Global Competition and Industry Drivers

The successful growth of nanotechnology can only occur if the right tools and instruments are available. Current and future markets, global competition, technical challenges faced by manufacturers,...

http://www.azonano.com/article.aspx?ArticleID=1295 | 7 Jul 2005
Focused Ion Beam (FIB) Microscope - Automated Gas Chemistry in Focused Ion Beam (FIB) Microscope by Omniprobe

Gas chemistries in the Focused Ion Beam (FIB) microscope play an important role in semiconductor metrology and process control. In the FIB in-situ lift-out process, gas-assisted etching speeds the...

http://www.azonano.com/article.aspx?ArticleID=2706 | 14 Oct 2010
Focused Ion Beam (FIB) Microscope - Nanomechanical Characterization in the Focused Ion Beam Microscope by Omniprobe

The availability of the Focused Ion Beam (FIB) microscope with its excellent imaging resolution, depth of focus and ion milling capability have made it an appealing platform for materials...

http://www.azonano.com/article.aspx?ArticleID=2705 | 13 Oct 2010
3D Defect Characterization With the Expida 1285 DualBeam (FIB SEM) - Supplier Data By FEI Company

The Expida 1285 DualBeam (FIB / SEM) is a fast 3D defect characterization system that provides an accurate picture of your process, leading to increased control and improved yield.

http://www.azonano.com/article.aspx?ArticleID=1193 | 15 Apr 2005
Structural Analysis And SEM-STEM Imaging With The Strata 400 STEM DualBeam (FIB / SEM) – Supplier Data By FEI Company

The Strata 400 STEM DualBeam (FIB / SEM) supports analytical laboratories' increasing need for high resolution analytical capabilities as device geometries shrink below 100 nm and new material systems...

http://www.azonano.com/article.aspx?ArticleID=1192 | 15 Apr 2005
Microscopic Medical Instruments on Road to Becoming Highly Functional

Nozomu Mishima, Tsuneo Kurita, and others of the Environmentally Conscious Design and Manufacturing Group, the Advanced Manufacturing Research Institute, the National Institute of Advanced...

http://www.azonano.com/news.aspx?newsID=11219 | 30 Apr 2009
UC Researcher Explores Possibility of Nanoscale Machining Facility

By Cameron Chai University of Cincinnati’s (UC) Micro and Nano Manufacturing Laboratory Director, Murali Sundaram is exploring the possibility of creating a cost -effective nano manufacturing...

http://www.azonano.com/news.aspx?newsID=23684 | 1 Nov 2011
Veeco Responds to a Need in the Precision Machining and Solar Markets with NT9080

Veeco Instruments Inc. (Nasdaq: VECO), a leader in scientific and industrial metrology, today introduced the NT9080(TM) Surface Metrology System, which combines non-contact white light...

http://www.azonano.com/news.aspx?newsID=15638 | 26 Jan 2010

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