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Nanometrics Launches Latest Version of the Orion High-Throughput Overlay Control System - News Item

The US metrology firm, Nanometrics, has released the newest version of its Orion Advanced Overlay Control System. The Orion is an advanced overlay metrology and analysis system for monitoring...

http://www.azonano.com/article.aspx?ArticleID=1124 | 2 Mar 2005
Characterising Defects and Contamination on Wafers Using Nanotechnology Expertise and Equipment from CEMMNT

The Centre of Excellence in Metrology for Micro and Nano Technologies (CEMMNT) provides access to equipment and expertise to accelerate product commercialisation. This article examines Wafer Crystal...

http://www.azonano.com/article.aspx?ArticleID=2062 | 12 Feb 2008
Measurement, Characterisation and Surface Analysis at the Micro and Nano Level Using Equipment and Expertise from CEMMNT

CEMMNT provide single point of access to comprehensive measurement, characterisation and surface analysis services from our team of world leading partners. Harnessing multi-disciplinary expertise, we...

http://www.azonano.com/article.aspx?ArticleID=2055 | 5 Feb 2008
Oxford Instruments - Metrology, Characterisation and Processing Solutions for Nanotechnology

Oxford Instruments designs, supplies and supports high-technology tools, processes and solutions for nanotechnology. Core technologies include low temperature and high magnetic field environments,...

http://www.azonano.com/article.aspx?ArticleID=1741 | 25 Sep 2006
Instrumentation, Tooling and Metrology - Markets, Challenges, Global Competition and Industry Drivers

The successful growth of nanotechnology can only occur if the right tools and instruments are available. Current and future markets, global competition, technical challenges faced by manufacturers,...

http://www.azonano.com/article.aspx?ArticleID=1295 | 7 Jul 2005
Micro Electro-Mechanical Systems MEMS – Measurement of Surface Features and Dimensions

Microelectro-mechanical systems are being utilized for a variety of applications such as microfluidic pumps, micromirror display devices, and acceleration and pressure sensors.

http://www.azonano.com/article.aspx?ArticleID=2808 | 8 Apr 2011
Physik Instrumente - Piezo Nanopositioning Equipment

Physik Instrumente (PI) is known throughout the high-tech world for its leadership in the design and manufacture of nanometer-level motion control products (nanopositioners), piezo ceramics and...

http://www.azonano.com/article.aspx?ArticleID=1593 | 9 Jun 2006
Piezo Flexure Nanopositioners and Scanners – An Introduction to Piezo Flexure Nanopositioners and Scanners by Physik Intrumente

The advantages of using piezo flexure nanopositioners and scanning systems over more convention positioners are explained. Factors such as operation, speed and accuracy sre considered.

http://www.azonano.com/article.aspx?ArticleID=1592 | 9 Jun 2006
Nanopositioning - Recent Advances including Parallel Kinematics, Active Trajectory Control, Vibration Suppression and Tracking Error Elimination by Physik Instrumente

This technote reports on recent advancements in nanopositioning technology, such as parallel kinematics, active trajectory control, new control algorithms for vibration suppression and tracking error...

http://www.azonano.com/article.aspx?ArticleID=1590 | 7 Jun 2006
Design and Characterisation of Nanometer Precision Mechanisms – Supplier Data by Queensgate Instruments

To meet the demands of ultra-precision positioning and scanning, a series of precision positioning mechanisms have been developed by Queensgate Instruments. They combine piezoelectric and NanoSensor...

http://www.azonano.com/article.aspx?ArticleID=1464 | 9 Dec 2005

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