Initially introduced as an accessory to scanning tunneling microscopy (STM), atomic force microscopy (AFM) has become an advanced and most valuable scanning probe technique broadly used in academic...
http://www.azonano.com/article.aspx?ArticleID=1533 | 10 Mar 2006
Traditionally electrical charges are carried and sometimes shielded using metal but this isn't ideal- especially if the current has to run past or through explosive material like petrol tanks. The...
TappingMode imaging is the most versatile mode of atomic force microscopy in conditions where a fluid layer severely limits the applicability of both, contact mode and non-contact techniques....
http://www.azonano.com/article.aspx?ArticleID=2095 | 2 Apr 2008
The Innova SPM from Bruker is an ideal instrument for high resolution imaging of delicate samples. In addition, the Innova combines this outstanding core performance with generous data acquisition...
http://www.azonano.com/article.aspx?ArticleID=2096 | 3 Apr 2008
In the experiment discussed here the thin layer of diblock copolymer is formed by spin-coating from solution. Sarfus was used to investigate the surface structure of the diblock copolymer.
http://www.azonano.com/article.aspx?ArticleID=2373 | 6 Sep 2009
mPhase Technologies, Inc. today announced it has entered into an agreement with Lucent Technologies to develop nanotechnology-based power cell technology. Posted March 17 2004
http://www.azonano.com/article.aspx?ArticleID=654 | 22 Mar 2004
Like crystals, by making periodic structures, devices such as optoelectric devices, information storage, and optic sensors can be created. In this note, to achieve such periodic structures (or...
http://www.azonano.com/article.aspx?ArticleID=2513 | 15 Feb 2010
Most surface metrology needs can be met by one of three complementary tools that can be supplied by Bruker - the white light interferometer, the atomic force microscope and the stylus profilometer
http://www.azonano.com/article.aspx?ArticleID=2143 | 1 May 2008