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MicroMedia From Buhler, Perl Mill Micro Beads for Milling Better Products

MicroMedia P1 is the new Buhler agitated bead mill on pilot scale for particularly demanding products. Depending on the requirements of different material systems, the operating conditions can be...

http://www.azonano.com/article.aspx?ArticleID=1964 | 17 Aug 2007
Atomic Force Microscopes Used As Molecular Milling Machines - New Technology

Nanoscientists hope to remake AFMs to more accurately create molecular scale structures

http://www.azonano.com/article.aspx?ArticleID=206 | 25 Nov 2003
Field Emission Scanning Electron Microscopy Using The Nova NanoLab, Versatile, High-Performance DualBeam FIB - SEM from FEI Company

The Nova™ NanoLab is a versatile, high-performance DualBeam™ (FIB / SEM) designed to support the high-end lab requirements of the nanotechnology, material science and life science markets.

http://www.azonano.com/article.aspx?ArticleID=1190 | 15 Apr 2005
Focused Ion Beam (FIB) Microscope - Automated Gas Chemistry in Focused Ion Beam (FIB) Microscope by Omniprobe

Gas chemistries in the Focused Ion Beam (FIB) microscope play an important role in semiconductor metrology and process control. In the FIB in-situ lift-out process, gas-assisted etching speeds the...

http://www.azonano.com/article.aspx?ArticleID=2706 | 14 Oct 2010
Enhanced Nanopositioning Resolution Using Patented DAC, Digital to Analog Converter, Control Technique Known As HyperBit from Physik Instrumente

Increasingly, DAC's are a limiting factor in nanopositioning resolution. A Physik Instrumente patented technology adds up to 10 bits of resolution to virtually any OEM DAC and popular PC analog I/O...

http://www.azonano.com/article.aspx?ArticleID=1589 | 7 Jun 2006
3D Defect Characterization With the Expida 1285 DualBeam (FIB SEM) - Supplier Data By FEI Company

The Expida 1285 DualBeam (FIB / SEM) is a fast 3D defect characterization system that provides an accurate picture of your process, leading to increased control and improved yield.

http://www.azonano.com/article.aspx?ArticleID=1193 | 15 Apr 2005
Structural Analysis And SEM-STEM Imaging With The Strata 400 STEM DualBeam (FIB / SEM) – Supplier Data By FEI Company

The Strata 400 STEM DualBeam (FIB / SEM) supports analytical laboratories' increasing need for high resolution analytical capabilities as device geometries shrink below 100 nm and new material systems...

http://www.azonano.com/article.aspx?ArticleID=1192 | 15 Apr 2005
KYOCERA’s New Milling Cutters with MEGACOAT NANO Technology

Kyocera Industrial Ceramics Corporation, Cutting Tool Division recently introduced its new MEW M-Four and MFWN M-Six Milling Cutters, both featuring unique advantages and inserts with MEGACOAT NANO,...

http://www.azonano.com/news.aspx?newsID=25737 | 16 Oct 2012
New Solutions for Particle Milling and Sizing from Fritsch on Display at POWTECH 2011

FRITSCH is an internationally respected manufacturer of application-oriented laboratory instruments for sample preparation and particle sizing. Laboratories worldwide rely on our quality and...

http://www.azonano.com/news.aspx?newsID=23158 | 4 Aug 2011
FRITSCH Premium Line - A Completely New Dimension in High-Tech Milling

Discover with the new FRITSCH premium line a completely new dimension in high-tech milling. For the first time ever, never known before, rotational speeds and ultrafine grinding results down...

http://www.azonano.com/news.aspx?newsID=16731 | 30 Mar 2010

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