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Results 1 - 10 of 79 for Nanometrology.

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True Topography AFM Scanning Using A Low Noise Z-Position Sensor

Atomic force microscopes (AFMs) use a piezoelectric crystal to actuate the positioning scanner. Creep and hysteresis errors however limit the capability of measuring the sample topography. This...

http://www.azonano.com/article.aspx?ArticleID=2990 | 13 Mar 2012
The Diamond Revolution: Big-Time Applications for Really Small Diamonds

Over the last 10 years, diamond as a technological material has seen a renewed and increasing level of interest with genuine potential. In particular nanodiamonds are being looked at for uses such as...

http://www.azonano.com/article.aspx?ArticleID=2531 | 4 Mar 2010
Nanometrology - What is Nanometrology?

If we can't measure a product quickly, precisely, and inexpensively, then we can't build it. This is especially true at the nanoscale. Nanometrology encompasses the cutting edge technologies of...

http://www.azonano.com/nanotechnology-video-details.aspx?VidID=328
Raman Spectroscopy to Play a Major Role in Nanometrology and Nanoscience

By Cameron Chai Research and Markets has added a book called "Raman Spectroscopy in Graphene Related Systems" to their offering. This book was published by John Wiley and Sons. Recent studies have...

http://www.azonano.com/news.aspx?newsID=22583 | 2 Jun 2011
Centre for Molecular Nanometrology Uses Nanosight to Develop New Biosensors

The Centre for Molecular Nanometrology at the University of Strathclyde has selected an LM10 characterisation system from Nanosight to aid in their research and development of new biosensors....

http://www.azonano.com/news.aspx?newsID=13614 | 11 Sep 2009
Nanotechnology and the Emerging Fields of Nanoelectronics, Nanofabrication and Nanometrology to be Showcased at NIST Conference

To aid in the practical application of new innovations and capitalize on technology transfer opportunities, the Maryland Technology Development Corporation (TEDCO), the Tech Council...

http://www.azonano.com/news.aspx?newsID=6070 | 13 Mar 2008
Nanopositioning Stages Now With Longer Travel Ranges for Microscopy, Nanometrology and Interferometry

PI (Physik Instrumente) L.P., a leading manufacturer of nanopositioning and precision motion-control equipment semiconductor and photonics applications, has extended its PIHera® family of...

http://www.azonano.com/news.aspx?newsID=5970 | 28 Feb 2008
Nanometrology Sensors Measuring Displacement, Vibration, Thickness - New Brochure From Physik Instrumente

PI (Physik Instrumente) L.P. a leading manufacturer of ultra-precision motion-control and sensing equipment for bio / nanotechnology, photonics, semiconductor and life science...

http://www.azonano.com/news.aspx?newsID=4573 | 27 Jul 2007
Park Systems Inc

Park Systems developed the world’s first commercial AFM in 1989, opening up a new world of research and development. Park Systems provides original and innovative AFM solutions for the most...

http://www.azonano.com/suppliers.aspx?SupplierID=1599
Design for Precision - Precision and Nanometrology (Advanced Level)

Course Overview This new module on Design for Precision - Precision & Nanometrology is the advanced training programme for this technological area focussing on the design of nano measuring...

http://www.azonano.com/courses/CourseDetails.aspx?CourseID=795 | 2 Sep 2008

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