Home
Home
Articles
News
Directory
Equipment
Experts
Classifieds
Books
News
Atomic Force Microscopes
Bionanotechnology
Carbon Nanotubes
Control Systems
Data Loggers
Dendrimers
Fullerenes
Graphene
Lab on a Chip
MEMS - NEMS
Microscopy
Nanoanalysis
Nanobusiness
Nanoelectronics
Nanoenergy
Nanoethics
Nanofabrication
Nanofluidics
Nanoindentation
Nanolithography
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics and Nanophotonics
Nanoregulations
Nanosensors
Nanotoxicology
Quantum Dots
Articles
Latest Articles
Thought Leaders
Commercializing Nanotechnology
AZojono - Journal of Nanotechnology
Global Market Reports
Materials
Suppliers A to Z
Applications
Industries
Equipment
Aerosol Coating Equipment
AFM Tips, Probes, Cantilevers
Atom Probes
Atomic Emission Spectrometers
Atomic Force Microscopes (AFM)
Atomic Layer Deposition (ALD) Systems
Biomedical Atomic Force Microscopes (bio-AFM)
Calorimeters
Carrier Concentration Profiler
Control Systems
Cryogenic Probe Stations
Data Loggers
Dynamic Light Scattering Instruments
Electrical Conductivity Measurement Systems
Electron Backscattered Diffraction (EBSD) Systems
Ellipsometers
Energy Dispersive X-Ray Spectroscopy (EDS)
Flow Chemistry Reactors
Focused Ion Beam (FIB) Accessories
Focused Ion Beam (FIB) Systems
FT-IR and FT-NIR Spectrometers
Helium Ion Beam Microscopes (HIM)
Induction Heating
Micro Hardness Testers
Microfluidic Devices
Micropositioning Systems
Mills for Reducing Particle Size
Moisture Analyzers
Nanofiber Production Equipment
Nanoimprint Lithography Equipment
Nanoimprint Lithography Templates
Nanoindentation Testers
Nanolithography Systems
Nanoparticle Characterization Systems
Nanoparticle Production Systems
Nanopositioning Systems
Optical Characterization Systems
Optical Tweezers
Particle Size Analyzers
Photoluminescence Mapper
Piezo Actuators
Plasma Cleaning Systems
Plasma Etching Systems
Profilometers
Raman Spectrometers
Sample Preparation Equipment
Scanning Electron Microscope (SEM) Accessories
Scanning Electron Microscopes (SEM)
Scanning Near-Field Optical Microscopes (SNOM)
Scanning Probe Microscopes (SPM)
Scratch Testers
Separation Membranes
Spectrofluorometers
Spectrometers
Spectrophotometers
Spectroscopic Ellipsometers
Sputtering Systems
Streak Cameras
Surface Area Analyzers
TEM Sample Holders and Supplies
Thermal Analysis Equipment
Thermal Desorption Equipment
Thin Film and Coating Thickness Measurement Tools
Thin-Film Deposition Systems
Time Delay Integration (TDI) Cameras
Transmission Electron Microscopes
Tribometers - Friction and Wear Testers
Ultrasonic Processing Equipment
Vibration Isolation Systems
Wafer Bonders
X-Ray Cameras
X-Ray Diffractometers
X-Ray Fluorescence Analyzers
Zeta Potential Analyzers
Classifieds
Books
Bionanotechnology
Carbon Nanotubes
Dendrimers
Fullerenes
MEMS - NEMS
Microscopy
Nanodevices
Nanoelectronics
Nanoenergy
Nanolithography
Nanomaterials
Nanomedicine
Nanotechnology
Nanotoxicology
Quantum Dots
Journals
Nanoelectronics
Nanoethics
Nanofabrication and Processing Technologies
Nanofluidics
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics
Nanosensors
Nanotechnology
Quantum Physics
Spectroscopy
Videos
Atomic Force Microscopes
Graphene
ICONN 2010 Interviews
Lab on a Chip
Microfluidics - Devices and Systems
MRS 2008 Fall Meeting Video Interviews
MRS 2010 Fall Meeting Video Interviews
MRS 2011 Fall Meeting Video Interviews
MRS 2012 Fall Meeting Video Interviews
Nanoanalysis
NanoArt
Nanomanipulation
Nanomaterials
Nanooptics and Nanophotonics
Nanosensors
Nanotechnology and the Environment
Nanotechnology Applications
Nanotechnology in Aerospace
Nanotechnology in Energy
Nanotechnology in Medicine
Nanotechnology in Semiconductors
Nanotechnology Overviews
Nanotubes
Pittcon 2009 Video Interviews
Pittcon 2012 Interviews
Self Assembly
X-Ray Diffraction
Courses
Courses
Events
About
Contact
Meet the Team
Help/FAQs
Terms
Search
Advertise
June 18, 2013
Browse by:
Materials
|
Applications
|
Industries
About
Advertise
Terms
Site Sponsors
Latest Nano News
Nanounity Distribute Pemtron Scanning Electron Microscopes
GLOBALFOUNDRIES’ 28nm HKMG Technology Helps Rockchip Ramp up Production of Mobile Processors
Frost & Sullivan Honors mPhase Technologies for Pioneering Nanobattery Technology
Nanotechnology Increases Demand for High-Precision Dimensional Metrology Equipment
X-FAB Enhances XP018 Process to Lower Chip Costs for Smart Analog Ics
Site Sponsors
Search
Request for Quote (RFQ): If you'd like us to help you source a Quotation for any particular products or from any suppliers, please
click here
. Once submitted, we will try and place you in contact with a suitable supplier within 48 hours.
Videos
Experts
Journals
Courses
Events
Classifieds
Search is Loading...
All
News
Articles
Suppliers
Equipment
Books
More
Results
1
-
10
of
307
for
Nanooptics
.
Search
Next>
Wafer Level Optics - Introduction and Solutions Available for Wafer Level Optics by EV Group
EV Group offers manufacturers a complete range of solutions, including master stamp fabrication, replication and integration of optical elements at wafer level based on its well-established mask...
http://www.azonano.com/article.aspx?ArticleID=2769
|
17 Jan 2011
Nanotechnology - Understanding and Acknowledging the Risks Associated with Nanotechnology
Nanotechnology is widely regarded as one of the most important sources of new technology over coming decades. However, there are also ethical, legal, policy and social issues that need to be...
http://www.azonano.com/article.aspx?ArticleID=2353
|
21 Aug 2009
Nanotechnology - An Introduction, History, Potential Benefits and Social Implications of Nanotechnology
Nanotechnology is technology distinguished primarily by the scale at which it acts: one billionth of a metre, or one ten-thousandth the width of a human hair. In the simplest terms, nanotechnology is...
http://www.azonano.com/article.aspx?ArticleID=2352
|
21 Aug 2009
Research Group Focuses on Fabrication and Characterization of Nanoelectronic and Optical Devices - Customer Profile by WITec
The research of the Nanoscale Electronics and Photonics Group of Prof. Brongersma at Stanford University is focused on the fabrication and characterization of nanometer-sized electronic and optical...
http://www.azonano.com/article.aspx?ArticleID=2031
|
7 Nov 2007
Fiber Optic Oxygen Sensors and How Fiber Optic Oxygen Sensors Work by Ocean Optics
Ocean Optics Fiber Optic Oxygen Sensors use the fluorescence of a chemical complex in a sol-gel to measure the partial pressure of oxygen. The pulsed blue LED sends light to an optical fiber. The...
http://www.azonano.com/article.aspx?ArticleID=2024
|
5 Nov 2007
Thin Film Thickness Determination Using an Interference Technique by Ocean Optics
This article illustrates a technique for determining thin film thickness by using an interference based technique
http://www.azonano.com/article.aspx?ArticleID=2023
|
5 Nov 2007
Multi Layered Dichroic Patterned Optical Coatings for Optomechanical and Optoelectronic Devices Using Optical Coating Technology from Ocean Optics
Ocean Optics has pioneered an optical coating technology that provides a precise, cost-effective means to integrate a variety of optical thin film coatings into the design and manufacture of an entire...
http://www.azonano.com/article.aspx?ArticleID=2022
|
5 Nov 2007
Pulsed, Laser Pattern Generator for Making or Writing Small Features on Wafers or Substrates from NextTechs
A laser pattern generator for mask making or direct writing of features on a wafer or other substrate uses a pulsed laser source to achieve high power and short wavelength radiation, for writing very...
http://www.azonano.com/article.aspx?ArticleID=2005
|
10 Oct 2007
Nanomotion, Developing and Manufacturing Precision Servo Motors and Positioning Systems for Micromechanic Applications
Utilizing breakthrough proprietary technology, Nanomotion develops and manufactures unique ceramic servo motors and positioning systems that provide superior motion solutions based on the level of...
http://www.azonano.com/article.aspx?ArticleID=2004
|
9 Oct 2007
Imaging Ellipsometers From Accurion for Optical Determination of Film Thickness and Optical Properties
Ellipsometry is a well-known non-destructive optical method for determining film thickness and optical properties. Imaging Ellipsometry combines the power of ellipsometry with microscopy and overcomes...
http://www.azonano.com/article.aspx?ArticleID=1982
|
18 Sep 2007
Result Page
1
2
3
4
5
6
7
8
9
10
Next