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Results 1 - 10 of 17 for Omniprobe.

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Oxford Instruments Launch Omniprobe 400 - Next Generation Nanomanipulator

An innovative new nanomanipulator with a resolution of 10 atoms is generating interest across a wide spectrum of industries. The OmniProbe® 400, Oxford Instruments’ latest tool, is optimised for...

http://www.azonano.com/news.aspx?newsID=25505 | 7 Sep 2012
In-situ Lift-Out (INLO) Strategies - Overview and Advantages of Lift-Out Strategies for Xtreme Access (XA) Owners by Omniprobe

INLO is the most secure, successful strategy for lift-out compared to ex-situ methods and non-welding in-situ methods, with a success rate of 90-100%.

http://www.azonano.com/article.aspx?ArticleID=2704 | 13 Oct 2010
Omniprobe Appoints Agar Scientific to Distribute Accessories and Consumables for FIB and SEM Analysis

Agar Scientific is pleased to announce that they have been appointed distributors for Omniprobe consumables and accessories. Omniprobe have been notable for their innovation in creating new...

http://www.azonano.com/news.aspx?newsID=5989 | 29 Feb 2008
Omniprobe

Omniprobe, Inc. is an industry leader in the manufacturing of accessories enabling "nano-lab" capabilities for electron and ion beam microscopes. Products include innovative...

http://www.azonano.com/suppliers.aspx?SupplierID=2235
Focused Ion Beam (FIB) Microscope - Automated Gas Chemistry in Focused Ion Beam (FIB) Microscope by Omniprobe

Gas chemistries in the Focused Ion Beam (FIB) microscope play an important role in semiconductor metrology and process control. In the FIB in-situ lift-out process, gas-assisted etching speeds the...

http://www.azonano.com/article.aspx?ArticleID=2706 | 14 Oct 2010
Focused Ion Beam (FIB) Microscope - Nanomechanical Characterization in the Focused Ion Beam Microscope by Omniprobe

The availability of the Focused Ion Beam (FIB) microscope with its excellent imaging resolution, depth of focus and ion milling capability have made it an appealing platform for materials...

http://www.azonano.com/article.aspx?ArticleID=2705 | 13 Oct 2010
nanoTensile™ 5000 - Defining Nanoscale Tensile and Pull Testing Using The nanoTensile™ 5000 From Hysitron Incorporated

The nanoTensile 5000 automated test system from Hysitron combines enables simplified small-scale tensile testing with a state-of-the-art instrument which, in its design, inherently solves the various...

http://www.azonano.com/article.aspx?ArticleID=1752 | 3 Oct 2006
Total Release Method for FIB Lift-Out from Omniprobe

The Total Release method for FIB lift-out from Omniprobe has many distinct features for high-throughput TEM sample preparation. This method needs a minimal ion milling for sample excise and transports...

http://www.azonano.com/nanotechnology-video-details.aspx?VidID=638
ShortCut™ Sample Preparation System from Omniprobe

The external Short-Cut™ tool is an important component of the AutoProbe™ 300 integrated solution. The Short-Cut™ accomplishes fast and easy ex-situ attachment of the lift-out sample to a TEM grid....

http://www.azonano.com/equipment-details.aspx?EquipID=394
SST™ and GLL™ Sample Transfer Systems from Omniprobe

Omniprobe was the first company to offer tools specifically tailored for TEM sample preparation inside the FIB and drove the revolutionary process now known as in-situ lift-out across the industry....

http://www.azonano.com/equipment-details.aspx?EquipID=393

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