Omniprobe, Inc. is an industry leader in the manufacturing of accessories enabling "nano-lab" capabilities for electron and ion beam microscopes. Products include innovative...
Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes and ion-beam systems,...
An innovative new nanomanipulator with a resolution of 10 atoms is generating interest across a wide spectrum of industries. The OmniProbe® 400, Oxford Instruments’ latest tool, is optimised for...
http://www.azonano.com/news.aspx?newsID=25505 | 7 Sep 2012
INLO is the most secure, successful strategy for lift-out compared to ex-situ methods and non-welding in-situ methods, with a success rate of 90-100%.
http://www.azonano.com/article.aspx?ArticleID=2704 | 13 Oct 2010
Established in 1972, Agar Scientific is a leading international supplier of consumables, accessories and specialist equipment for all disciplines of microscopy.We have our own manufacturing...
Agar Scientific is pleased to
announce that they have been appointed distributors for Omniprobe
consumables and accessories.
Omniprobe have been notable for their innovation in creating
http://www.azonano.com/news.aspx?newsID=5989 | 29 Feb 2008
Gas chemistries in the Focused Ion Beam (FIB) microscope play an important role in semiconductor metrology and process control. In the FIB in-situ lift-out process, gas-assisted etching speeds the...
http://www.azonano.com/article.aspx?ArticleID=2706 | 14 Oct 2010
The availability of the Focused Ion Beam (FIB) microscope with its excellent imaging resolution, depth of focus and ion milling capability have made it an appealing platform for materials...
http://www.azonano.com/article.aspx?ArticleID=2705 | 13 Oct 2010
The nanoTensile 5000 automated test system from Hysitron combines enables simplified small-scale tensile testing with a state-of-the-art instrument which, in its design, inherently solves the various...
http://www.azonano.com/article.aspx?ArticleID=1752 | 3 Oct 2006
The Total Release method for FIB lift-out from Omniprobe has many distinct features for high-throughput TEM sample preparation. This method needs a minimal ion milling for sample excise and transports...