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Digital Pulsed Force Mode Provides New Prospective for Nanoscale Materials Research by WITec
The Digital Pulsed Force Mode (DPFM) provides new perspectives for materials research on the nanometer scale. Its ability to store the full tip-sample interaction during an AFM imaging process allows...
http://www.azonano.com/article.aspx?ArticleID=2032
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7 Nov 2007
Nondestructive Characterization of a Polymer Nanocoating using WITec Alpha300 AR - Application Note by WITec
Characterization of heterogeneous systems on the nanometer scale continues to grow in importance and to impact key applications in the field of materials science (phase segregated systems),...
http://www.azonano.com/article.aspx?ArticleID=2033
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7 Nov 2007
Applications of Functionalized PMMA Derivatives in Nanobiomedicine and Nanotechnology
PMMA is a non water soluble polymer that can be synthesized in a very controllable way by different polymerization techniques, with a narrow molecular distribution and it is easily functionalizable....
http://www.azonano.com/article.aspx?ArticleID=2399
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22 Sep 2009
Creep Behaviour Investigation Using Micro or Nano Indentation Tester (MHT/NHT) From CSM Instruments
It has been shown that the indentation creep can be easily determined using the CSM Instruments Micro and Nano Indentation Tester (MHT and NHT). The indentation creep coefficient is defined as the...
http://www.azonano.com/article.aspx?ArticleID=1801
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5 Dec 2006
Characterization of Polymeric Materials Using nanoIR
The nanoIR system from Anasys Instruments enables IR Spectroscopy with 100 nm spatial resolution. It also provides high resolution topographic, mechanical, chemical, and thermal mapping. Applications...
http://www.azonano.com/article.aspx?ArticleID=2922
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19 Jul 2011
Breakthrough in Ultra Thin Photo Resists and Dielectrics for Semiconductors from Nanometrix
Nanometrix Inc. has announced a breakthrough in ultra thin "photo resist" and dielectrics for semiconductors. They have has been successful in producing films of photo resist on silicon wafers ¡Ü 25nm...
http://www.azonano.com/article.aspx?ArticleID=1441
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21 Nov 2005
Scanning Near-Field Optical Microscopy (SNOM or NSOM) - Different Methods of Operation
Scanning Near-Field Optical Microscopes (SNOM or NSOM) offer far greater resolution than traditional optical microscopes. Conducting experiments using SNOM, feedback mechanisms, Photon Scanning...
http://www.azonano.com/article.aspx?ArticleID=1205
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21 Apr 2005
Evident Technologies Introduces EviDot Composites - New Product
Evident Technologies announced today that it is the first company to make commercially available a composite of quantum dots (semiconductor nanocrystals) in common polymers and matrix materials....
http://www.azonano.com/article.aspx?ArticleID=647
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19 Mar 2004
Fine Tuning Strength and Conductivity of Nanotube Laced Materials - New Technology
Materials fortified with carbon nanotubes are strongest when the embedded filaments run parallel to each other, but electronic and thermal conductivity are best when the nanotubes are oriented...
http://www.azonano.com/article.aspx?ArticleID=381
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9 Jan 2004
Imaging Organic Compound Assemblies like Oligomers, Polymers and Alkane Derivatives Using Scanning Force Microscopy
This article examines the imaging of organic compounds, both natural and synthetic examples, such as alkanes, alkane derivatives and aromates using atomic force microscopy
http://www.azonano.com/article.aspx?ArticleID=2076
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25 Feb 2008
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