Home
Home
Articles
News
Directory
Equipment
Experts
Classifieds
Books
News
Atomic Force Microscopes
Bionanotechnology
Carbon Nanotubes
Control Systems
Data Loggers
Dendrimers
Fullerenes
Graphene
Lab on a Chip
MEMS - NEMS
Microscopy
Nanoanalysis
Nanobusiness
Nanoelectronics
Nanoenergy
Nanoethics
Nanofabrication
Nanofluidics
Nanoindentation
Nanolithography
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics and Nanophotonics
Nanoregulations
Nanosensors
Nanotoxicology
Quantum Dots
Articles
Latest Articles
Thought Leaders
Commercializing Nanotechnology
AZojono - Journal of Nanotechnology
Global Market Reports
Materials
Suppliers A to Z
Applications
Industries
Equipment
Aerosol Coating Equipment
AFM Tips, Probes, Cantilevers
Atom Probes
Atomic Emission Spectrometers
Atomic Force Microscopes (AFM)
Atomic Layer Deposition (ALD) Systems
Biomedical Atomic Force Microscopes (bio-AFM)
Calorimeters
Carrier Concentration Profiler
Control Systems
Cryogenic Probe Stations
Data Loggers
Dynamic Light Scattering Instruments
Electrical Conductivity Measurement Systems
Electron Backscattered Diffraction (EBSD) Systems
Ellipsometers
Energy Dispersive X-Ray Spectroscopy (EDS)
Flow Chemistry Reactors
Focused Ion Beam (FIB) Accessories
Focused Ion Beam (FIB) Systems
FT-IR and FT-NIR Spectrometers
Helium Ion Beam Microscopes (HIM)
Induction Heating
Micro Hardness Testers
Microfluidic Devices
Micropositioning Systems
Mills for Reducing Particle Size
Moisture Analyzers
Nanofiber Production Equipment
Nanoimprint Lithography Equipment
Nanoimprint Lithography Templates
Nanoindentation Testers
Nanolithography Systems
Nanoparticle Characterization Systems
Nanoparticle Production Systems
Nanopositioning Systems
Optical Characterization Systems
Optical Tweezers
Particle Size Analyzers
Photoluminescence Mapper
Piezo Actuators
Plasma Cleaning Systems
Plasma Etching Systems
Profilometers
Raman Spectrometers
Sample Preparation Equipment
Scanning Electron Microscope (SEM) Accessories
Scanning Electron Microscopes (SEM)
Scanning Near-Field Optical Microscopes (SNOM)
Scanning Probe Microscopes (SPM)
Scratch Testers
Separation Membranes
Spectrofluorometers
Spectrometers
Spectrophotometers
Spectroscopic Ellipsometers
Sputtering Systems
Streak Cameras
Surface Area Analyzers
TEM Sample Holders and Supplies
Thermal Analysis Equipment
Thermal Desorption Equipment
Thin Film and Coating Thickness Measurement Tools
Thin-Film Deposition Systems
Time Delay Inegration (TDI) Cameras
Transmission Electron Microscopes
Tribometers - Friction and Wear Testers
Ultrasonic Processing Equipment
Vibration Isolation Systems
Wafer Bonders
X-Ray Cameras
X-Ray Diffractometers
X-Ray Fluorescence Analyzers
Zeta Potential Analyzers
Classifieds
Books
Bionanotechnology
Carbon Nanotubes
Dendrimers
Fullerenes
MEMS - NEMS
Microscopy
Nanodevices
Nanoelectronics
Nanoenergy
Nanolithography
Nanomaterials
Nanomedicine
Nanotechnology
Nanotoxicology
Quantum Dots
Journals
Nanoelectronics
Nanoethics
Nanofabrication and Processing Technologies
Nanofluidics
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics
Nanosensors
Nanotechnology
Quantum Physics
Spectroscopy
Videos
Atomic Force Microscopes
Graphene
ICONN 2010 Interviews
Lab on a Chip
Microfluidics - Devices and Systems
MRS 2008 Fall Meeting Video Interviews
MRS 2010 Fall Meeting Video Interviews
MRS 2011 Fall Meeting Video Interviews
MRS 2012 Fall Meeting Video Interviews
Nanoanalysis
NanoArt
Nanomanipulation
Nanomaterials
Nanooptics and Nanophotonics
Nanosensors
Nanotechnology and the Environment
Nanotechnology Applications
Nanotechnology in Aerospace
Nanotechnology in Energy
Nanotechnology in Medicine
Nanotechnology in Semiconductors
Nanotechnology Overviews
Nanotubes
Pittcon 2009 Video Interviews
Pittcon 2012 Interviews
Self Assembly
X-Ray Diffraction
Courses
Courses
Events
About
Contact
Meet the Team
Help/FAQs
Terms
Search
Advertise
May 19, 2013
Browse by:
Materials
|
Applications
|
Industries
About
Advertise
Terms
Site Sponsors
Latest Nano News
American Graphite Provides Update on Graphene Paper Project with CTI Nanotechnologies
New Report on Prospects of the Global Nanotechnology Industry
Nanoantenna Pattern Enables New Way of Turning Infrared Light into Mechanical Action
Silica Nanoparticles Reduce Wear and Friction of PTFE
Berkeley Design Automation Introduces ACE System to Analyze Nanometer-Scale Analog and Mixed-Signal Circuits
Site Sponsors
Search
Request for Quote (RFQ): If you'd like us to help you source a Quotation for any particular products or from any suppliers, please
click here
. Once submitted, we will try and place you in contact with a suitable supplier within 48 hours.
Videos
Experts
Journals
Courses
Events
Classifieds
Search is Loading...
All
News
Articles
Suppliers
Equipment
Books
More
Results
1
-
10
of
62
for
Particle X-rays
.
Search
Next>
Researchers at Argonne National Laboratory Grow Carbon Nanotubes with Wing – Like Extensions
In an attempt to create nanocomposites incorporating carbon nanotubes and diamond, scientists at Argonne National Laboratory created nanotubes with graphitic wings. Posted July 16th, 2004
http://www.azonano.com/article.aspx?ArticleID=1028
|
10 Aug 2004
New Accurate Metrics for X-ray and Neutron Analysis of Flexible Macromolecules
A dramatic leap forward in the ability of scientists to study the structural states of macromolecules such as proteins and nanoparticles in solution has been achieved by a pair of researchers with...
http://www.azonano.com/news.aspx?newsID=27227
|
29 Apr 2013
Silicon-Germanium Microelectronics Reduces Spacecraft Weight
Space environments can deliver a beating to spacecraft electronics. For decades, satellites and other spacecraft have used bulky and expensive shielding to protect vital...
http://www.azonano.com/news.aspx?newsID=13862
|
28 Sep 2009
Bismuth Oxide - NanoArc® Bismuth Oxide Nanomaterials From Nanophase Technologies Corporation
This article looks at NanoArc® Bismuth oxide from Nanophase. Bismuth Oxide can be incorporated into specialty polymers and materials for bone implants, dental prosthetic devices, catheters, sutures...
http://www.azonano.com/article.aspx?ArticleID=1727
|
13 Sep 2006
Which Particle Counter from Particle Measuring Systems is Best for You for the Measurement of Ultrapure Water (UPW) and Ultra Clean Fluids
The increasing cleanliness of liquids and the decreasing critical particle size has caused a corresponding increase in particle counter capability and cost.
http://www.azonano.com/article.aspx?ArticleID=2018
|
31 Oct 2007
With Extremely Short Wavelengths and Very High Intensities, Light-Matter Interaction Seems to be Different than Previously Accepted
By way of the classical photoeffect, Einstein proved in 1905 that light also has particle character. However, with extremely high light intensities, remarkable things happen in the process....
http://www.azonano.com/news.aspx?newsID=11098
|
24 Apr 2009
Scientists Produced Image at the Highest Resolution Ever Achieved with X-Ray Light
A team of scientists from the Technische Universität Dresden (Germany) and the ESRF in Grenoble (France) has produced the image of an object at the highest resolution ever achieved...
http://www.azonano.com/news.aspx?newsID=7372
|
30 Aug 2008
Homeland Defense: Novel Radiation Surveillance Technology Could Help Thwart Nuclear Terrorism
By Will SoutterTerrorism scenarios involving nuclear devices or materials are among those that cause the most concern. For that reason, technology that can effectively detect smuggled radioactive...
http://www.azonano.com/news.aspx?newsID=24770
|
2 May 2012
New Design Would Deliver More Precise Radiation Doses at Lower Cost
Four physicists at the U.S. Department of Energy's (DOE) Brookhaven National Laboratory have been awarded U.S. Patent No. 7,432,516 B2 for the design of a "medical synchrotron" capable of...
http://www.azonano.com/news.aspx?newsID=8864
|
24 Nov 2008
New Technique for Assessing Radiation Damage to DNA
A new technique for assessing the damage radiation causes to DNA indicates that the spatial arrangement of damaged sites, or lesions, is more important than the number of lesions in determining the...
http://www.azonano.com/news.aspx?newsID=6136
|
25 Mar 2008
Result Page
1
2
3
4
5
6
7
Next