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Results 11 - 20 of 97 for Polysilicon
  • News - 4 Sep 2008
    LDK Solar Co., Ltd., a leading manufacturer of solar wafers, today announced it has signed a new agreement with GT Solar International, Inc. to purchase polysilicon CVD reactors for installation in...
  • News - 3 Sep 2008
    GT Solar Incorporated, a global provider of specialized equipment and technology for the solar power industry, announced that on July 11, 2008, it signed a $173 million contract with DC Chemical Co.,...
  • News - 25 Aug 2008
    Trina Solar Limited, a leading integrated manufacturer of solar photovoltaic products from the production of ingots, wafers and cells to the assembly of PV modules, founded in 1997, today announced...
  • Video
    This video shows a 2 µm x 2 µm, 512 pixel x 512 pixel image of Polysilicon obtained using Bruker’s Dimension FastScan atomic force microscope (AFM).
  • Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...
  • Supplier Profile
    The "Centre d’Élaboration de Matériaux et d’Etudes Structurales" (CEMES/CNRS) is a CNRS laboratory (UPR 8011) associated with Université Paul Sabatier de Toulouse...
  • Supplier Profile
    Linde Electronics supplies the full range of ultra high purity gases and chemicals, systems and services to support electronics manufacturers. In the photovoltaic industry, Linde supplies...
  • Supplier Profile
    Scanwel is your authorised distributor of high quality Scanning Probe Microscope (SPM) accessories from NT-MDT. In Scanning Probe Microscopy, the perfect instrument is only half of the story. The...
  • Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • Article - 26 May 2008
    Spectroscopic ellipsometry characterizes TFT-LCD panels, assessing a-Si and LTPS layer thickness, optical constants, and p-Si grain size with high accuracy.

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