Initially introduced as an accessory to scanning tunneling microscopy (STM), atomic force microscopy (AFM) has become an advanced and most valuable scanning probe technique broadly used in academic...
http://www.azonano.com/article.aspx?ArticleID=1533 | 10 Mar 2006
Since the introduction of Scanning Probe Microscopy it has been applied to the research of polymer materials. Both Scanning Tunneling Microscopy and contact mode Atomic Force Microscopy proved to be a...
http://www.azonano.com/article.aspx?ArticleID=2299 | 20 Feb 2009
AZoNano talks to Sergei Magonov about NT-MDT's new HybriD™ AFM Mode, which combines the best aspects of contact and oscillatory modes, opening up new applications of AFM technology.
http://www.azonano.com/article.aspx?ArticleID=3544 | 2 Jul 2013
The Innova SPM from Bruker is an ideal instrument for high resolution imaging of delicate samples. In addition, the Innova combines this outstanding core performance with generous data acquisition...
http://www.azonano.com/article.aspx?ArticleID=2096 | 3 Apr 2008
TappingMode imaging is the most versatile mode of atomic force microscopy in conditions where a fluid layer severely limits the applicability of both, contact mode and non-contact techniques....
http://www.azonano.com/article.aspx?ArticleID=2095 | 2 Apr 2008
This article examines the imaging of organic compounds, both natural and synthetic examples, such as alkanes, alkane derivatives and aromates using atomic force microscopy
http://www.azonano.com/article.aspx?ArticleID=2076 | 25 Feb 2008