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Low-Noise Interferometry Enables Precision Three-Dimensional Surface Characterization

Optical profilers that employ white light interferometry are one of the most accurate and flexible metrology tools for precision three-dimensional surface characterization. They are instrumental in an...

http://www.azonano.com/article.aspx?ArticleID=2326 | 22 Jun 2009
Three-Dimensional Surface Profiling with Dektak Surface Profilers and Vision Analysis Software

This application note describes the advantages of 3D measurement options available through a combination of Dektak Stylus Profiler and Vision 3D analysis software.

http://www.azonano.com/article.aspx?ArticleID=2322 | 22 Jun 2009
DektakXT Surface Profilers - Automatic Step Detection Feature for DektakXT Surface Profilers from Bruker

DektakXT stylus profilers provide accurate step height measurements from several nanometers through hundreds of microns, with repeatability down to 7.5 Angstroms.

http://www.azonano.com/article.aspx?ArticleID=2321 | 22 Jun 2009
Precision Surface Metrology Enables Increased Yield and Lower Overall Production Cost of Solar Cells

The rapid, accurate, and versatile metrology solutions offered by Veeco's stylus and optical profilers are being utilized by many solar cell manufacturers to increase yield and lower the overall...

http://www.azonano.com/article.aspx?ArticleID=2319 | 22 Jun 2009
Dektak XT Surface Profiler With the Best Performance, Best Repeatability and Largest Standard Scanning Range

The Dektak® XT Surface Profiler system has the best performance, repeatability and largest standard scanning range, with a variety of configurations and options for superior programmability,...

http://www.azonano.com/article.aspx?ArticleID=2108 | 11 Apr 2008
Greater Measurement Detail with High Definition Vertical Scanning Interferometry from Bruker

Optical profilers are microscopes that use the interference of two beams of light for characterizing surface topographies. Bruker’s high-definition vertical scanning interferometry (HDVSI) mode uses...

http://www.azonano.com/article.aspx?ArticleID=2103 | 4 Apr 2008
Innovative Microfluidic Chip Enables Rapid and Accurate Cancer Profiling

Identify the type of cancer for patients with breast cancer in a few minutes. This is the challenge that EPFL researchers successfully met by presenting their new “microfluidic chip.”...

http://www.azonano.com/news.aspx?newsID=27099 | 12 Apr 2013
Bruker Ship 100th DektakXT Stylus Surface Profiling System

Bruker Nano Surfaces Division (Tucson, AZ) has shipped 100 DektakXT Stylus Surface Profiling System since the product launched last April. The DektakXT features improved ease of use and the...

http://www.azonano.com/news.aspx?newsID=24600 | 3 Apr 2012
Scientists Invent Novel Molecular Depth Profiling Method

By Cameron Chai Scientists at the Penn State University (PSU) have discovered an innovative method for in-depth profiling of molecules. Molecular profiling is essential to evaluate the...

http://www.azonano.com/news.aspx?newsID=23582 | 13 Oct 2011
SmartChip MicroRNA Panel for Gene Profiling

By Cameron Chai WaferGen Biosystems has unveiled its SmartChip Human microRNA Panel V2 to enable gene expression profiling on the SmartChip Real-Time PCR platform. The V2 analyzes microRNAs...

http://www.azonano.com/news.aspx?newsID=22062 | 31 Mar 2011

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