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Rapid Progress Reported in Emerging Field of Molecular Electronics - News Item

A recent study indicates that the emerging field of molecular electronics using nanoscale molecules as key components in computers and other electronic devices is in excellent health and has a bright...

http://www.azonano.com/article.aspx?ArticleID=1112 | 17 Feb 2005
Tetronics Limited - Company Profile

Tetronics are manufacturers of nanopowders. They use a range of processes such as DC plasma arc to manufacture metal and ceramic nanopowders.

http://www.azonano.com/article.aspx?ArticleID=943 | 8 Jun 2004
AFM Confocal Raman & Tip Enhanced TERS Solutions

Nanoscale imaging is a rapidly evolving field. Several techniques are available for sample characterization. Here the benefits of having a single system integrating different analysis methods such as...

http://www.azonano.com/article.aspx?ArticleID=2989 | 12 Mar 2012
Polyalkylene Carbonate Organic Binders for Nanoparticles - QPAC by Empower Materials

QPAC® 40 polypropylene carbonate and QPAC® 25 polyethylene carbonate are used as organic binders in several nanoparticle related applications. Details of these applications and properties of these...

http://www.azonano.com/article.aspx?ArticleID=2648 | 1 Aug 2010
Determining Storage Capacity and Heat of Adsorption for Metal Organic Frameworks using the ASAP 2050 and HPVA-100 from Micromeritics

Micromeritics Analytical Services ( MAS ) can now perform high-pressure sorption analysis using the Micromeritics ASAP 2050 Accelerated Surface Area and Porosity analyzer or the Particulate Systems...

http://www.azonano.com/article.aspx?ArticleID=2627 | 2 Jul 2010
Current and Future Development in Ceramics - An Interview with The American Ceramic Society

More recently the the ACerS have rolled out a new web site offering more to members, including news and access to the well respected Journal of the American Ceramic Society and access to new phase...

http://www.azonano.com/article.aspx?ArticleID=2211 | 15 Jul 2008
Characterization of Thin Film Transistors and Low Temperature Poly Silicon TFT-LCD Display Panels by Spectroscopic Ellipsometry Using Equipment From Horiba Scientific - Thin Film

In this article spectroscopic ellipsometry was used to characterize both thicknesses and optical constants of TFT-LCD devices. Moreover the grain size of p-Si materials was investigated during the...

http://www.azonano.com/article.aspx?ArticleID=2173 | 26 May 2008
Spectroscopic Ellipsometry of Compound Semiconductors AlxGa1-xN / GaN Hetero-Structures Using Equipment from Horiba Scientific - Thin Film

Spectroscopic Ellipsometry is a non-destructive optical characterization method that allows determination of material parameters like layer thickness and optical properties

http://www.azonano.com/article.aspx?ArticleID=2165 | 21 May 2008
Characterization of Photovoltaic Devices by Spectroscopic Ellipsometry Using Equipment from Horiba Scientific - Thin Film

Spectroscopic ellipsometry is an optical measurement technique used to determine thin film thickness and optical constants simply and accurately. This article illustrates the ability of the technique...

http://www.azonano.com/article.aspx?ArticleID=2164 | 20 May 2008
Breaking Barriers of Routine Scanning Probe Microscopy and the Stability of SPM Experiments Using NTEGRA Heads from NT-MDT

This article examines the use of various NTEGRA products from NT-MDT for overcoming the short comings or failures of straight scanning probe microscopy

http://www.azonano.com/article.aspx?ArticleID=2048 | 21 Jan 2008

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