Home
Home
Articles
News
Directory
Equipment
Experts
Classifieds
Books
News
Atomic Force Microscopes
Bionanotechnology
Carbon Nanotubes
Control Systems
Data Loggers
Dendrimers
Fullerenes
Graphene
Lab on a Chip
MEMS - NEMS
Microscopy
Nanoanalysis
Nanobusiness
Nanoelectronics
Nanoenergy
Nanoethics
Nanofabrication
Nanofluidics
Nanoindentation
Nanolithography
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics and Nanophotonics
Nanoregulations
Nanosensors
Nanotoxicology
Quantum Dots
Articles
Latest Articles
Thought Leaders
Commercializing Nanotechnology
AZojono - Journal of Nanotechnology
Global Market Reports
Materials
Suppliers A to Z
Applications
Industries
Equipment
Aerosol Coating Equipment
AFM Tips, Probes, Cantilevers
Atom Probes
Atomic Emission Spectrometers
Atomic Force Microscopes (AFM)
Atomic Layer Deposition (ALD) Systems
Biomedical Atomic Force Microscopes (bio-AFM)
Calorimeters
Carrier Concentration Profiler
Control Systems
Cryogenic Probe Stations
Data Loggers
Dynamic Light Scattering Instruments
Electrical Conductivity Measurement Systems
Electron Backscattered Diffraction (EBSD) Systems
Ellipsometers
Energy Dispersive X-Ray Spectroscopy (EDS)
Flow Chemistry Reactors
Focused Ion Beam (FIB) Accessories
Focused Ion Beam (FIB) Systems
FT-IR and FT-NIR Spectrometers
Helium Ion Beam Microscopes (HIM)
Induction Heating
Micro Hardness Testers
Microfluidic Devices
Micropositioning Systems
Mills for Reducing Particle Size
Moisture Analyzers
Nanofiber Production Equipment
Nanoimprint Lithography Equipment
Nanoimprint Lithography Templates
Nanoindentation Testers
Nanolithography Systems
Nanoparticle Characterization Systems
Nanoparticle Production Systems
Nanopositioning Systems
Optical Characterization Systems
Optical Tweezers
Particle Size Analyzers
Photoluminescence Mapper
Piezo Actuators
Plasma Cleaning Systems
Plasma Etching Systems
Profilometers
Raman Spectrometers
Sample Preparation Equipment
Scanning Electron Microscope (SEM) Accessories
Scanning Electron Microscopes (SEM)
Scanning Near-Field Optical Microscopes (SNOM)
Scanning Probe Microscopes (SPM)
Scratch Testers
Separation Membranes
Spectrofluorometers
Spectrometers
Spectrophotometers
Spectroscopic Ellipsometers
Sputtering Systems
Streak Cameras
Surface Area Analyzers
TEM Sample Holders and Supplies
Thermal Analysis Equipment
Thermal Desorption Equipment
Thin Film and Coating Thickness Measurement Tools
Thin-Film Deposition Systems
Time Delay Integration (TDI) Cameras
Transmission Electron Microscopes
Tribometers - Friction and Wear Testers
Ultrasonic Processing Equipment
Vibration Isolation Systems
Wafer Bonders
X-Ray Cameras
X-Ray Diffractometers
X-Ray Fluorescence Analyzers
Zeta Potential Analyzers
Classifieds
Books
Bionanotechnology
Carbon Nanotubes
Dendrimers
Fullerenes
MEMS - NEMS
Microscopy
Nanodevices
Nanoelectronics
Nanoenergy
Nanolithography
Nanomaterials
Nanomedicine
Nanotechnology
Nanotoxicology
Quantum Dots
Journals
Nanoelectronics
Nanoethics
Nanofabrication and Processing Technologies
Nanofluidics
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics
Nanosensors
Nanotechnology
Quantum Physics
Spectroscopy
Videos
Atomic Force Microscopes
Graphene
ICONN 2010 Interviews
Lab on a Chip
Microfluidics - Devices and Systems
MRS 2008 Fall Meeting Video Interviews
MRS 2010 Fall Meeting Video Interviews
MRS 2011 Fall Meeting Video Interviews
MRS 2012 Fall Meeting Video Interviews
Nanoanalysis
NanoArt
Nanomanipulation
Nanomaterials
Nanooptics and Nanophotonics
Nanosensors
Nanotechnology and the Environment
Nanotechnology Applications
Nanotechnology in Aerospace
Nanotechnology in Energy
Nanotechnology in Medicine
Nanotechnology in Semiconductors
Nanotechnology Overviews
Nanotubes
Pittcon 2009 Video Interviews
Pittcon 2012 Interviews
Self Assembly
X-Ray Diffraction
Courses
Courses
Events
About
Contact
Meet the Team
Help/FAQs
Terms
Search
Advertise
June 19, 2013
Browse by:
Materials
|
Applications
|
Industries
About
Advertise
Terms
Site Sponsors
Latest Nano News
Micronit Announces Cleanroom Expansion to Meet Demands in MEMS and Microfluidics Fields
Comprehensive Report on US Nanotechnology Drug Delivery Market
Nanounity Distribute Pemtron Scanning Electron Microscopes
GLOBALFOUNDRIES’ 28nm HKMG Technology Helps Rockchip Ramp up Production of Mobile Processors
Frost & Sullivan Honors mPhase Technologies for Pioneering Nanobattery Technology
Site Sponsors
Search
Request for Quote (RFQ): If you'd like us to help you source a Quotation for any particular products or from any suppliers, please
click here
. Once submitted, we will try and place you in contact with a suitable supplier within 48 hours.
Videos
Experts
Journals
Courses
Events
Classifieds
Search is Loading...
All
News
Articles
Suppliers
Equipment
Books
More
Results
1
-
10
of
948
for
SEM
.
Search
Next>
SEM and FIB Lithography Kits - ELPHY Nanolithography Systems for your SEM, FIB or SEM-FIB by Raith
With the expertise of 20 years Raith ELPHY systems are most versatile and offer best performance at affordable prices. Raith offers a worldwide, proven infrastructure to install, train and support...
http://www.azonano.com/article.aspx?ArticleID=2254
|
12 Nov 2008
3D Defect Characterization With the Expida 1285 DualBeam (FIB SEM) - Supplier Data By FEI Company
The Expida 1285 DualBeam (FIB / SEM) is a fast 3D defect characterization system that provides an accurate picture of your process, leading to increased control and improved yield.
http://www.azonano.com/article.aspx?ArticleID=1193
|
15 Apr 2005
Field Emission Scanning Electron Microscope For Nanotechnology Applications; The Nova NanoSEM – Supplier Data By FEI Company
Following the successful introduction of the Nova NanoLab DualBeam SEM/FIB nanotechnology workstation, FEI Company introduces the next Nova Tools for Nanotech family member: the Nova NanoSEM. This...
http://www.azonano.com/article.aspx?ArticleID=1189
|
15 Apr 2005
In-situ Lift-Out (INLO) Strategies - Overview and Advantages of Lift-Out Strategies for Xtreme Access (XA) Owners by Omniprobe
INLO is the most secure, successful strategy for lift-out compared to ex-situ methods and non-welding in-situ methods, with a success rate of 90-100%.
http://www.azonano.com/article.aspx?ArticleID=2704
|
13 Oct 2010
El-Mul Technologies - Detection Tools for Industrial SEM and Mass Spectrometry
El-Mul Technologies has established itself as an advanced technology leader in the semiconductor manufacturing, industrial SEM and mass spectrometry tool markets. A brief list of some of their...
http://www.azonano.com/article.aspx?ArticleID=1902
|
11 May 2007
Tescan – Scanning Electron Microscopes ( SEM ) and Image Processors
Tescan provides high quality, dependable scanning electron microscopy products and services. As well as SEM's, Tescan also supply hardware and software for digital image processing.
http://www.azonano.com/article.aspx?ArticleID=1901
|
10 May 2007
Research and Educational Use of The Personal Scanning Electron Microscope From Aspex
ASPEX PSEM is uniquely capable of fitting smoothly and productively into an industrial research and development environment. The affordable scanning electron microscope also is a wonderful way to...
http://www.azonano.com/article.aspx?ArticleID=1887
|
27 Mar 2007
New Generation in X-ray Microscopy for X-ray Fluorescence and Transmission Analysis
HORIBA Scientific, the analytical instruments division of Horiba Ltd, have announced the worldwide launch of its new generation of X-Ray microscopes the XGT-5000. Posted Ocotber 8 2003
http://www.azonano.com/article.aspx?ArticleID=107
|
13 Nov 2003
Dielectric Etching - Comparison of Etch Processes for Etching SiO2 Dielectric Films by Oxford Instruments Plasma Technology
This paper compares different aspects of dielectric etching. The two leading techniques for etching dielectric are discussed, namely diode RIE and high density based processes. We will also look at...
http://www.azonano.com/article.aspx?ArticleID=2740
|
26 Nov 2010
Precision Technologies CIC – Measurement, Understanding and Optimisation
Experts at the Precision Precision Technologies CIC use the latest technologies, processes and equipment in our advanced Nanolab to help UK and international manufacturing companies to use...
http://www.azonano.com/article.aspx?ArticleID=1928
|
21 Jun 2007
Result Page
1
2
3
4
5
6
7
8
9
10
Next