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Scanning Probe Lithography (SPL) – A Basic Look At Using Scanning Probe Microscopes as a Tool In Next Generation Nanolithographic Techniques Including Applications and Resolution

Several lithographic techniques are used for patterning in the nanoscale region. The technique of Scanning Probe Lithography (SPL) uses the scanning tunneling microscope (STM) to produce...

http://www.azonano.com/article.aspx?ArticleID=1744 | 25 Sep 2006
Nanostructured Aluminium Doped Zinc Oxide (AZO) Sputter Targets – Properties and Applications

AZO is a highly pure nanostructured aluminium doped zinc oxide with typical aluminium content between 0.5 to 2 wt%. Innovnano also offers custom combinations. AZO sputter targets are used to produce...

http://www.azonano.com/article.aspx?ArticleID=2972 | 10 Feb 2012
Continuous Wafer-Scale Graphene Films Prepared by Chemical Vapor Deposition: Production and Applications

CVD graphene is made by flowing hydrogen and methane gases through a furnace heated to about 1000°C with a metal catalyst such as copper or nickel. It can be prepared as multi or monolayers and...

http://www.azonano.com/article.aspx?ArticleID=2962 | 28 Nov 2011
Nanoscale Etching Using the Cobra ICP Source

Oxford Instruments Plasma Technology has been working on nanoscale etching that features sizes below 100 nm for several years and they are continually adding to their ‘portfolio’ of materials etched.

http://www.azonano.com/article.aspx?ArticleID=2955 | 16 Nov 2011
Quantum Dots Embedded in a Sub-Wavelength Nanoslit Array for Controlling Photon Emissions

Nanocrystal quantum dots are embedded in a sub-wavelength metallic nanoslit array to produce highly directional emission and beaming of photons. This technology has potential application for displays,...

http://www.azonano.com/article.aspx?ArticleID=2939 | 14 Oct 2011
Advanced and User-Friendly AFM Imaging and Measurement Systems

LOT QuantumDesign offers the XE series of AFM’s from Park Systems which have many new advanced features and are extremely user-friendly. They also supply a range of automated AFMs for higher end,...

http://www.azonano.com/article.aspx?ArticleID=2853 | 6 May 2011
nCLEAR - Atomic Layer Deposition of Inorganic Barrier Coatings for Flexible and Organic Electronics by Beneq

The need for efficient moisture and oxygen barrier films is a major challenge in flexible and organic electronics, of which organic light emitting diodes (OLED) and organic photovoltaics (OPV) are two...

http://www.azonano.com/article.aspx?ArticleID=2762 | 14 Jan 2011
Micro Hardness Determination of Cured Lacquer on Thin Polymer Film Substrates Using Equipment from Fischer Instrumentation

This article describes the methology for evaluation of hardness of coated polymers and thin films for touch screen applications using the Fischerscope HM2000S from Fischer Instrumentation

http://www.azonano.com/article.aspx?ArticleID=2182 | 28 May 2008
Characterization of Thin Film Transistors and Low Temperature Poly Silicon TFT-LCD Display Panels by Spectroscopic Ellipsometry Using Equipment From Horiba Scientific - Thin Film

In this article spectroscopic ellipsometry was used to characterize both thicknesses and optical constants of TFT-LCD devices. Moreover the grain size of p-Si materials was investigated during the...

http://www.azonano.com/article.aspx?ArticleID=2173 | 26 May 2008
Spectroscopic Ellipsometry of Compound Semiconductors AlxGa1-xN / GaN Hetero-Structures Using Equipment from Horiba Scientific - Thin Film

Spectroscopic Ellipsometry is a non-destructive optical characterization method that allows determination of material parameters like layer thickness and optical properties

http://www.azonano.com/article.aspx?ArticleID=2165 | 21 May 2008

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