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Results 1 - 10 of 379 for SPM
  • Bruker Nano Surfaces and Metrology
    Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • RHK Technology
    Supplier Profile
    RHK delivers compelling value and proven quality to broaden the frontiers of atomic scale research. We stand ready to meet your specifications and exceed your expectations. RHK’s surface...
  • AIST-NT Inc
    Supplier Profile
    AIST-NT Co. is a young, dynamic company founded with the simple goal of satisfying our customers' needs and exceeding their expectations. Virtually every member of the team has 20 years...
  • Image Metrology A/S
    Supplier Profile
    Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processing software for "nano-microscopy". Our mission is to provide our customers with...
  • DME Nanotechnologie GmbH
    Supplier Profile
    For over 20 years, DME has successfully dealt with the development and manufacturing of atomic force microscopes. In this connection DME's key points are easy usability, manufacturing by...
  • Semilab Semiconductor Physics Laboratory
    Supplier Profile
    Semilab Semiconductor Physics Laboratory designs, produces and sells metrology equipment for the characterization of semiconductor and photovoltaic materials, for monitoring the manufacturing process...
  • DME Ultra-High Vacuum SPM - Versatile SPM for UHV
    Equipment
    Common UHV SPMs are very specialized and far behind the ease of use of today’s standard AFMs or SPMs.
  • KLA Instruments™
    Supplier Profile
    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • Scanning Probe Microscopy (SPM), Atomic Force Microscopy and SPM Lithography - Methods of Operation
    Article - 27 Apr 2005
    Scanning Probe Microscopy (SPM) is a powerful tool used to study surfaces and surface properties at nanometre resolution. Different operating modes for Scanning Tunneling Microscopes (STM) and Atomic...
  • R9 SPM Control System for all SPM Modes and Techniques from RHK Technology
    Equipment
    The unique R9 from RHK Technology is constructed based on nearly 25 years of technological expertise in scanning probe microscopy.

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