Nantero is a nanotechnology company using carbon nanotubes for the development of next-generation semiconductor devices. These devices include memory, logic, and other semiconductor products. In the...
TSMC has claimed to have produced the first fully functional 65 nanometre SRAM module. Posted April 13 2004
http://www.azonano.com/article.aspx?ArticleID=762 | 19 Apr 2004
AXcess News released a story covering the latest breakthroughs in nanotechnology and some of the companies’ investors should be watching. Posted April 26 2004
http://www.azonano.com/article.aspx?ArticleID=827 | 7 May 2004
Toshiba Corporation (TOKYO:6502), IBM (NYSE: IBM), and AMD (NYSE:AMD) today announced that they have together developed a Static Random Access Memory (SRAM) cell that has an area of only 0.128 square...
http://www.azonano.com/news.aspx?newsID=9203 | 17 Dec 2008
IBM and its joint development
partners -- AMD, Freescale, STMicroelectronics, Toshiba and the College of Nanoscale
Science and Engineering (CNSE) -- today announced the first working static...
http://www.azonano.com/news.aspx?newsID=7201 | 18 Aug 2008
SureCore Ltd has today announced that early testing of its innovative low power SRAM design confirms its simulations that deliver in excess of 50% power savings over other SRAM...
http://www.azonano.com/news.aspx?newsID=29789 | 1 Apr 2014
As phones and other electronics shrink in size, they’ve grown in capabilities and ubiquitousness.
But, as semiconductors – the omnipresent and indispensable building blocks of...
http://www.azonano.com/news.aspx?newsID=29177 | 17 Jan 2014
sureCore Ltd has announced that it has taped out its low power SRAM IP demonstrator chip in STMicroelectronics’ 28nm Fully Depleted Silicon-on-Insulator (FD-SOI) process. The device will...
http://www.azonano.com/news.aspx?newsID=28638 | 30 Oct 2013
ProPlus Design Solutions, Inc. announced today that Semiconductor Manufacturing International Corporation ("SMIC") has deployed ProPlus' NanoYield™ High-Sigma (HS) within...
http://www.azonano.com/news.aspx?newsID=27366 | 16 May 2013
Gold Standard Simulations (GSS) revealed today that the interplay between the effects of statistical reliability and variability could adversely affect 20nm CMOS SRAM yield. The study also defined...
http://www.azonano.com/news.aspx?newsID=27133 | 17 Apr 2013