Laser Scanning Confocal Microscopy (LSM or LSCM) and Scanning Near-Field Optical Microscopy (SNOM) are the two optical microscopy techniques used to break the diffraction limit of resolution. Both...
http://www.azonano.com/article.aspx?ArticleID=1241 | 13 May 2005
Scanning Near-Field Optical Microscopy (SNOM) lets scientists study forbidden light and allowed light. This article looks at forbidden light, allowed light, the Constant Height Mode Scanning process,...
http://www.azonano.com/article.aspx?ArticleID=1252 | 26 May 2005
Scanning Near-Field Optical Microscopes (SNOM or NSOM) offer far greater resolution than traditional optical microscopes. Conducting experiments using SNOM, feedback mechanisms, Photon Scanning...
http://www.azonano.com/article.aspx?ArticleID=1205 | 21 Apr 2005
SNOM is the acronym for Scanning Near-Field Optical Microscopy, an alternative name for NSOM (Near-Field Scanning Optical Microscopy). The resolution achieved is far better than that which...
http://www.azonano.com/article.aspx?ArticleID=2618 | 23 Jun 2010
The key features and capabilities of the Park Systems XE-NSOM, atomic force microscope incorporating near-field scanning optical microscopy are demonstrated and a details explanation of its operation...
WiTec systems have come up with a new series of microscopes that are flexible and can be used in different microscopic applications. The new series is named Alpha Series and combine Atomic force...
http://www.azonano.com/article.aspx?ArticleID=2852 | 6 May 2011
NT-MDT develops for you the complete line of SPMs including AFMs, STMs, SNOMs which cover most of scientific and industrial applications. NT-MDT's instruments incorporate MEMS technology, modern...
http://www.azonano.com/article.aspx?ArticleID=1541 | 3 May 2006
Scanning near-field optical microscopy (SNOM) gives an ability to study optical properties of the sample (reflectivity, light transmission, light scattering) with the spatial resolution of tens of...
http://www.azonano.com/article.aspx?ArticleID=2250 | 27 Oct 2008
This article examines the use of various NTEGRA products from NT-MDT for overcoming the short comings or failures of straight scanning probe microscopy
http://www.azonano.com/article.aspx?ArticleID=2048 | 21 Jan 2008
The alpha300 S is a user friendly Scanning Near-field Optical Microscope (SNOM) that combines in a unique way the advantages of SNOM, Confocal Microscopy and Atomic Force Microscopy in a single...