STIL manufactures and sells stand-alone chromatic confocal sensors as well as a turnkey high precision, multi-sensor 3D measuring system (MICROMESURE).
A second technological activity of STIL...
Nova Measuring Instruments Ltd. is a leading global semiconductor equipment
manufacturer with solutions and services that are used by 21 of the largest
25 IC manufacturers. Nova's expertise in...
Article - 15 Feb 2006
There are numerous analytical methods for establishing the surface roughness as well as the visualization of surface texture. Each of these methods has its own advantages and disadvantages. This...
News - 22 Feb 2016
Nano-electronics research center Imec and Nova Measuring Instruments, a leading innovator and key provider of metrology solutions for advanced process control used in semiconductor manufacturing,...
News - 27 Feb 2010
As computer chips rapidly continue to evolve, new technologies must be developed to closely monitor the fabrication process and guard against faults at a sub-microscopic level.
More than 40 years...
News - 22 Feb 2010
As computer chips rapidly continue to evolve, new technologies must be developed
to closely monitor the fabrication process and guard against faults at a sub-microscopic
News - 7 Sep 2012
National Institute of Standards and Technology (NIST) has devised a hybrid metrology technique that could reduce the uncertainties related to the measurement of features on the computer chip. The...
News - 30 Jun 2009
Nova Measuring Instruments
Ltd. (NASDAQ: NVMI) provider of leading edge stand-alone metrology and the
market leader of integrated metrology solutions to the semiconductor process
News - 15 Jul 2015
Nanometrics Incorporated, a leading provider of advanced process control systems, today kicks off formal commemoration of its 40th Anniversary Year in conjunction with SEMICON West, the...
News - 1 Apr 2010
CEA-Leti, a leading global research center committed to creating and commercializing innovation in micro- and nanotechnologies, said today that its Hybrid Metrology Project has developed a way to...