FLX Micro is the first company to develop a process to cost-effectively microfabricate poly-SiC for high volume applications. We partner with manufacturers and suppliers to develop...
k-Space specializes in in-situ, real-time thin-film process monitoring tools. Since 1992 we have been developing quality integrated systems engineered to customer input and feedback. Our suite of...
Starfire Systems, Inc. offers a wide range of patented silicon carbide (SiC) ceramic forming polymers and material systems that companies use to meet performance and cost targets where high...
Graphensic AB is located in Linköping, Sweden. The company is a spin-off from Linköping University research and was founded by Rositza Yakimova, Mikael Syväjärvi and Tihomir...
Cree, Inc. is a market-leading innovator and manufacturer of semiconductors that enhance the value of LED solid-state lighting, power and communications products by significantly increasing their...
Microelectrode (MEAs) and nanoelectrode arrays can be used to study the activities of whole cells and tissues. This article looks at lab-on-a-chip projects using 3C-SiC technology, solid-state MEAs,...
http://www.azonano.com/article.aspx?ArticleID=1212 | 27 Apr 2005
At Oxford Instruments Plasma Technology ave recently optimized the growth procedure to improve structural properties and surface morphology of thick AlN layers deposited via hydride vapor-phase...
http://www.azonano.com/article.aspx?ArticleID=2715 | 27 Oct 2010
The Centre of Excellence in Metrology for Micro and Nano Technologies (CEMMNT) provides access to equipment and expertise to accelerate product commercialisation. This article examines Wafer Crystal...
http://www.azonano.com/article.aspx?ArticleID=2062 | 12 Feb 2008
NanoProducts Corporation is pleased to report the successful use of its nanoscale materials to produce tires with improved skid resistance and reduced abrasion. Posted July 17 2003
http://www.azonano.com/article.aspx?ArticleID=193 | 21 Nov 2003
The kSA BandiT is a non-contact, non-invasive, real-time, absolute wafer temperature sensor. Using the temperature-dependent optical absorption edge of semiconductor materials, the kSA BandiT provides...
http://www.azonano.com/article.aspx?ArticleID=1492 | 8 Feb 2006