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Nanoparticle Sizing and Key Factors For Accuracy when Measuring Nanoparticle Size Distributions in Real Time Using the TSI Scanning Mobility Particle Sizer

In this article, key factors which play a significant role in accuracy for real time online measurement of aerosolized nanoparticles using the electrical mobility technique of Scanning Mobility...

http://www.azonano.com/article.aspx?ArticleID=1987 | 27 Sep 2007
Real Time Measurement of Nanoparticle Size Distributions using Electrical Mobility Technique and the Scanning Mobility Particle Sizer from TSI Incorporated

This article provides a brief overview of the electrical mobility technology as integrated in TSI Scanning Mobility Particle Sizer (SMPS) spectrometer followed by a discussion on applications in...

http://www.azonano.com/article.aspx?ArticleID=1985 | 26 Sep 2007
Temperature-Programmed Desorption (TPD) For Characterizing The Acid Sites On Oxide Surfaces

Temperature-Programmed Desorption (TPD) is one of the most widely used and flexible techniques for characterizing the acid sites on oxide surfaces.

http://www.azonano.com/article.aspx?ArticleID=1475 | 18 Jan 2006
Spectroscopy and Spectrometers – A Simple Look at Technology For Characterising Nanomaterials

When investigating and developing nanomaterials it is of paramount importance to know exactly what the material is that you are looking at. Spectrometers are the tools that give the composition of...

http://www.azonano.com/article.aspx?ArticleID=1816 | 19 Dec 2006
Scanning Mobility Particle Sizer Spectrometers from TSI, the Standard Setting Submicrometer Particle Sizers with Continuous Fast Scanning

Scanning Mobility Particle Sizer™ (SMPS) spectrometers from TSI are the standard by which all submicrometer particle sizers are compared. They employ a continuous, fast scanning technique to provide...

http://www.azonano.com/article.aspx?ArticleID=1990 | 27 Sep 2007
Analysis of Thin Magnetic Films Using Sputtered Neutral Mass Spectrometry (SNMS)

Sputtered Neutral Mass Spectrometry is perfect for analyzing thin metal films where composition, thickness and interface condition can be determined.

http://www.azonano.com/article.aspx?ArticleID=2970 | 21 Jan 2012
Depth Profile of Hard Drive Platter using Sputtered Neutral Mass Spectrometry by Hiden Analytical

Sputtered Neutral Mass Spectrometry is ideally suited to the analysis of thin films where composition, thickness and interface condition can be determined. In this example a hard drive platter is...

http://www.azonano.com/article.aspx?ArticleID=2696 | 17 Sep 2010
Springer Acquires Journal of The American Society for Mass Spectrometry

Starting in January 2011 Springer will publish the Journal of The American Society for Mass Spectrometry, the society's official journal, which was previously published by Elsevier. Appearing monthly,...

http://www.azonano.com/news.aspx?newsID=17803 | 1 Jun 2010
Novel Mass Spectrometry Imaging Technique Captures Kinetic World of Metabolites

What would you do with a camera that can take a picture of something and tell you how new it is? If you’re Berkeley Lab scientists Katherine Louie, Ben Bowen, Jian-Hua Mao and Trent Northen,...

http://www.azonano.com/news.aspx?newsID=27592 | 13 Jun 2013
Bruker Introduces Mass Spectrometry-Based Product Innovations at ASMS 2013

At the 61st ASMS Conference on Mass Spectrometry and Allied Topics, Bruker today announced mass spectrometry-based product introductions for life-science and clinical research, for...

http://www.azonano.com/news.aspx?newsID=27562 | 11 Jun 2013

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