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Results 1 - 10 of 49 for Spectroscopic Ellipsometry
  • Semilab Semiconductor Physics Laboratory
    Supplier Profile
    Semilab Semiconductor Physics Laboratory designs, produces and sells metrology equipment for the characterization of semiconductor and photovoltaic materials, for monitoring the manufacturing process...
  • HORIBA
    Supplier Profile
    HORIBA, headquartered in the United States, provides an extensive array of instruments and solutions for applications across a broad range of scientific R&D and QC measurements. HORIBA is a world...
  • J.A. Woollam
    Supplier Profile
    The J.A. Woollam Company was founded in 1987 by Dr. John A. Woollam. Starting as a spin-off from the University of Nebraska, the J.A. Woollam Company has rapidly grown to become a worldwide...
  • SE-1000 - Cost-Effective Spectroscopic Ellipsometry for Thin Film Characterization
    Equipment
    This page details the capabilities of the SE-1000, a spectroscopic ellipsometer used for thin-film characterization.
  • Spectroscopic Ellipsometry: What is it?
    Article - 1 Apr 2021
    Spectroscopic ellipsometry is an optical measurement method. It is utilized to measure the change in polarization of light when it travels through a medium. This then allows the extraction of the...
  • Photovoltaic Device Characterization by Spectroscopic Ellipsometry
    Article - 20 May 2008
    Spectroscopic ellipsometry characterizes photovoltaic materials like Si, ZnO, and ITO, enhancing solar cell efficiency and production.
  • Refractive Index Determination of Y2O3 on Glass
    Article - 22 May 2008
    Y2O3 films, used in AR coatings and laser designs, show high adhesion and transparency from UV to IR, with properties influenced by substrate type.
  • Characterization of Thin Film Transistors
    Article - 26 May 2008
    Spectroscopic ellipsometry characterizes TFT-LCD panels, assessing a-Si and LTPS layer thickness, optical constants, and p-Si grain size with high accuracy.
  • Characterization of Biotin Avidin System for Use of Biomaterials
    Article - 22 May 2008
    Exploring biosensors' molecular interactions using Spectroscopic Ellipsometry to measure biofilm thickness in biotin-avidin systems.
  • Spectroscopic Ellipsometer - SE-2000
    Equipment
    This page details information about the SE-2000, a spectroscopic ellipsometer with rotating compensator optics.

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