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Results 81 - 90 of 918 for TEM
  • Article - 19 Nov 2023
    Nanomedicine has demonstrated great efficacy in delivering an array of therapeutic compounds into the body's target sites. Here, we discuss the application of TEM in nanomedicine for drug discovery...
  • Article - 26 Aug 2015
    Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM) are widely considered the gold standard for nanoparticle characterization. However, choosing which to employ is a complex...
  • Supplier Profile
    Asylum Research is the technology leader in atomic force probe microscopy (AFM) for both materials and bioscience applications.  Founded in 1999, we are dedicated to innovative...
  • Supplier Profile
    Sigma-Aldrich® is a leading high-technology company. Through our Materials Chemistry Centers of Excellence in research and manufacturing we develop advanced, enabling materials for your...
  • Article - 11 May 2023
    This article discusses the application of transmission electron microscopy (TEM) to analyze metal nanoparticles.
  • News - 20 Sep 2010
    As of today, the LIBRA series Transmission Electron Microscopes (TEM) from Carl Zeiss take a leap forward by offering the new ZEMAS framework technology (ZEISS Electron Microscopy Applications...
  • News - 13 Jul 2009
    TEMwindows.com is celebrating its six-month business anniversary by launching new products, exhibiting at the Microscopy and Microanalysis 2009 conference, and increasing its reach through three new...
  • Supplier Profile
    Xenocs is a supplier of x-ray scattering equipment (SAXS/WAXS) for characterizing the nanostructure and morphology of materials at the nanoscale. Such equipment is used for the research, development,...
  • Article - 5 Feb 2024
    TEM is pivotal for characterizing gold nanoparticles, revealing their assembly and aiding the development of advanced nanodevices.
  • Article - 11 May 2023
    Electron microscopy methods are very well-suited to imaging nanoscale structures and so likely to remain one of the main characterization techniques for 2D materials and their defects.

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