This article describes how the UVISEL Spectroscopic Phase Modulated Ellipsometer from Horiba Jobin Yvon was used to characterize the influence of substrate to growth of Y2O3
http://www.azonano.com/article.aspx?ArticleID=2170 | 22 May 2008
Tantalum oxide (Ta2O5) nanoparticles are magnetic oxide nanoscale particles having a spherical form. Applications include medical imaging, coatings, alloys and catalysts.
http://www.azonano.com/article.aspx?ArticleID=3385 | 15 Apr 2013
Angstrom Sun Technologies Inc. is a privately held company, headquartered in Boston, USA. The focus of company is to provide a series of cost-effective optical solutions for characterizing thin film...
Instruments Inc. (Nasdaq: VECO) announced today the introduction of the
NEXUS(R) TAMR Physical Vapor Deposition (PVD) System for next-generation Thermal
Assisted Magnetic Recording...
http://www.azonano.com/news.aspx?newsID=18072 | 16 Jun 2010
Picosun Oy, Finland-based global manufacturer of state-of-the-art Atomic Layer Deposition (ALD) equipment, has successfully scaled up several new, important ALD processes.
Of compound materials,...
http://www.azonano.com/news.aspx?newsID=23874 | 30 Nov 2011
Picosun Oy, leading Atomic Layer Deposition (ALD) equipment manufacturer, reports excellent process results for copper diffusion barrier deposition. ALD materials for copper diffusion barriers were...
http://www.azonano.com/news.aspx?newsID=27565 | 11 Jun 2013
The SR300 Spectroscopic Reflectometer & Film Thickness Measurement System can be used to measure the film thickness, refractive index, reflection, transmission and absorption spectra of thin films and...
The MSP100 Microspectrophotometer and Thin Film Measurement System is used to characterize optical properties of thin films, thick coatings over a micron region area.