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  • Skyray XRF Thick-800 XRF Analyzer
    Equipment
    The Thick-800 is a non-destructive testing solution for organizations that need accurate quality control of printed circuit boards and electronics. Testing capabilities include multi-layer thickness...
  • Ar Gas Cluster Ion Source
    Equipment
    The multi-mode gas cluster ion source (GCIS) is designed to operate in both Arn+ cluster and Ar+ monatomic modes.

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