Home
Home
Articles
News
Directory
Equipment
Experts
Classifieds
Books
News
Atomic Force Microscopes
Bionanotechnology
Carbon Nanotubes
Control Systems
Data Loggers
Dendrimers
Fullerenes
Graphene
Lab on a Chip
MEMS - NEMS
Microscopy
Nanoanalysis
Nanobusiness
Nanoelectronics
Nanoenergy
Nanoethics
Nanofabrication
Nanofluidics
Nanoindentation
Nanolithography
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics and Nanophotonics
Nanoregulations
Nanosensors
Nanotoxicology
Quantum Dots
Articles
Latest Articles
Thought Leaders
Commercializing Nanotechnology
AZojono - Journal of Nanotechnology
Global Market Reports
Materials
Suppliers A to Z
Applications
Industries
Equipment
Aerosol Coating Equipment
AFM Tips, Probes, Cantilevers
Atom Probes
Atomic Emission Spectrometers
Atomic Force Microscopes (AFM)
Atomic Layer Deposition (ALD) Systems
Biomedical Atomic Force Microscopes (bio-AFM)
Calorimeters
Carrier Concentration Profiler
Control Systems
Cryogenic Probe Stations
Data Loggers
Dynamic Light Scattering Instruments
Electrical Conductivity Measurement Systems
Electron Backscattered Diffraction (EBSD) Systems
Ellipsometers
Energy Dispersive X-Ray Spectroscopy (EDS)
Flow Chemistry Reactors
Focused Ion Beam (FIB) Accessories
Focused Ion Beam (FIB) Systems
FT-IR and FT-NIR Spectrometers
Helium Ion Beam Microscopes (HIM)
Induction Heating
Micro Hardness Testers
Microfluidic Devices
Micropositioning Systems
Mills for Reducing Particle Size
Moisture Analyzers
Nanofiber Production Equipment
Nanoimprint Lithography Equipment
Nanoimprint Lithography Templates
Nanoindentation Testers
Nanolithography Systems
Nanoparticle Characterization Systems
Nanoparticle Production Systems
Nanopositioning Systems
Optical Characterization Systems
Optical Tweezers
Particle Size Analyzers
Photoluminescence Mapper
Piezo Actuators
Plasma Cleaning Systems
Plasma Etching Systems
Profilometers
Raman Spectrometers
Sample Preparation Equipment
Scanning Electron Microscope (SEM) Accessories
Scanning Electron Microscopes (SEM)
Scanning Near-Field Optical Microscopes (SNOM)
Scanning Probe Microscopes (SPM)
Scratch Testers
Separation Membranes
Spectrofluorometers
Spectrometers
Spectrophotometers
Spectroscopic Ellipsometers
Sputtering Systems
Streak Cameras
Surface Area Analyzers
TEM Sample Holders and Supplies
Thermal Analysis Equipment
Thermal Desorption Equipment
Thin Film and Coating Thickness Measurement Tools
Thin-Film Deposition Systems
Time Delay Inegration (TDI) Cameras
Transmission Electron Microscopes
Tribometers - Friction and Wear Testers
Ultrasonic Processing Equipment
Vibration Isolation Systems
Wafer Bonders
X-Ray Cameras
X-Ray Diffractometers
X-Ray Fluorescence Analyzers
Zeta Potential Analyzers
Classifieds
Books
Bionanotechnology
Carbon Nanotubes
Dendrimers
Fullerenes
MEMS - NEMS
Microscopy
Nanodevices
Nanoelectronics
Nanoenergy
Nanolithography
Nanomaterials
Nanomedicine
Nanotechnology
Nanotoxicology
Quantum Dots
Journals
Nanoelectronics
Nanoethics
Nanofabrication and Processing Technologies
Nanofluidics
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics
Nanosensors
Nanotechnology
Quantum Physics
Spectroscopy
Videos
Atomic Force Microscopes
Graphene
ICONN 2010 Interviews
Lab on a Chip
Microfluidics - Devices and Systems
MRS 2008 Fall Meeting Video Interviews
MRS 2010 Fall Meeting Video Interviews
MRS 2011 Fall Meeting Video Interviews
MRS 2012 Fall Meeting Video Interviews
Nanoanalysis
NanoArt
Nanomanipulation
Nanomaterials
Nanooptics and Nanophotonics
Nanosensors
Nanotechnology and the Environment
Nanotechnology Applications
Nanotechnology in Aerospace
Nanotechnology in Energy
Nanotechnology in Medicine
Nanotechnology in Semiconductors
Nanotechnology Overviews
Nanotubes
Pittcon 2009 Video Interviews
Pittcon 2012 Interviews
Self Assembly
X-Ray Diffraction
Courses
Courses
Events
About
Contact
Meet the Team
Help/FAQs
Terms
Search
Advertise
May 21, 2013
Browse by:
Materials
|
Applications
|
Industries
About
Advertise
Terms
Site Sponsors
Latest Nano News
Cambrios to Present on Silver Nanowire-Based Transparent Conductive Coating Material at Display Week 2013
Carbon Nanotube-Coated Carbon Fiber Composites for Next Generation of Airplanes
Defects Discovered in Nanoscale Coherent Twin Boundaries
Multitasking Neurons Improve Computational Power of the Brain
Dolomite to Productize Drop-Tech’s Innovative Microfluidic Device
Site Sponsors
Search
Request for Quote (RFQ): If you'd like us to help you source a Quotation for any particular products or from any suppliers, please
click here
. Once submitted, we will try and place you in contact with a suitable supplier within 48 hours.
Videos
Experts
Journals
Courses
Events
Classifieds
Search is Loading...
All
News
Articles
Suppliers
Equipment
Books
More
Results
1
-
10
of
120
for
TiO2
.
Search
Next>
Titanium (IV) Oxide (TiO2) Nanopowder - Features and Properties of Titanium (IV) Oxide Nanopowder by Strem Chemicals
Titanium dioxide, also known as titanium(IV) oxide or titania, is the naturally occurring oxide of titanium, chemical formula TiO2. It is noteworthy for its wide range of applications, from paint to...
http://www.azonano.com/article.aspx?ArticleID=2282
|
24 Jan 2009
Determination of the Refractive Index of Y2O3 on Glass and Pre Evaporated Substrates by Spectroscopic Ellipsometry Using Equipment from Horiba Scientific - Thin Film
This article describes how the UVISEL Spectroscopic Phase Modulated Ellipsometer from Horiba Jobin Yvon was used to characterize the influence of substrate to growth of Y2O3
http://www.azonano.com/article.aspx?ArticleID=2170
|
22 May 2008
Characterization of Photovoltaic Devices by Spectroscopic Ellipsometry Using Equipment from Horiba Scientific - Thin Film
Spectroscopic ellipsometry is an optical measurement technique used to determine thin film thickness and optical constants simply and accurately. This article illustrates the ability of the technique...
http://www.azonano.com/article.aspx?ArticleID=2164
|
20 May 2008
Nanoparticle and Nanotube Size Analysis Using the Scanning Mobility Particle Sizer Spectrometer from TSI Incorporated to Assess Health Risks
This article provides a brief overview of the electrical mobility technology as integrated in TSI Scanning Mobility Particle Sizer (SMPS) spectrometer followed by a discussion on applications in...
http://www.azonano.com/article.aspx?ArticleID=2117
|
21 Apr 2008
Real Time Measurement of Nanoparticle Size Distributions using Electrical Mobility Technique and the Scanning Mobility Particle Sizer from TSI Incorporated
This article provides a brief overview of the electrical mobility technology as integrated in TSI Scanning Mobility Particle Sizer (SMPS) spectrometer followed by a discussion on applications in...
http://www.azonano.com/article.aspx?ArticleID=1985
|
26 Sep 2007
Solar Cell Development and Using Nanotechnology in Next Generation, Cheap, Highly Efficient Solar Cells
A second generation of solar technology with either much greater conversion efficiency or lower materials cost is ready to come to the market. This technology, which includes thin films, organics,...
http://www.azonano.com/article.aspx?ArticleID=1972
|
22 Aug 2007
Buhler Wet Grinding and Dispersing Technologies, High Performance Production Equipment and Services For All Mixing, Dispersing and Wet Grinding Tasks
The Buhler Grinding & Dispersing Technologies business unit supplies advanced process technology, plants and equipment wherever wet grinding and dispersing processes including fully automatic...
http://www.azonano.com/article.aspx?ArticleID=1966
|
17 Aug 2007
Pentacene Film on TiO2 For Organic Thin Film Transistor (OTFT) Displays Examined Using An Atomic Force Microscope From NanoSurf
Pentacene seems to be the most promising material for OTFT displays. A control on the quality and flatness of such films is of great interest. AFM showed to be a valuable tool for the inspection of...
http://www.azonano.com/article.aspx?ArticleID=1853
|
22 Feb 2007
Hydrogen Production Using Environmentally Friendly Nanotechnology Based Techniques
Hydrogen has been touted as an environmentally friendly wonder fuel that can be used in vehicles and burns to produce only water as a by product. The problem with hydrogen is that producing it is far...
http://www.azonano.com/article.aspx?ArticleID=1841
|
7 Feb 2007
Dielectric Thin Film Measurements Using The Nano-Scratch Tester (NST) From CSM Instruments
This article features a typical example of a complete test carried out with the Nano Scratch Tester (NST) from CSM Instruments on a hard dielectric coating
http://www.azonano.com/article.aspx?ArticleID=1800
|
4 Dec 2006
Result Page
1
2
3
4
5
6
7
8
9
10
Next