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  • Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • Supplier Profile
    The Nano Science and Technology Institute (NSTI) is chartered with the promotion and integration of nano and other advanced technologies through education, technology and business development. NSTI...
  • Supplier Profile
    At PerkinElmer, we design, manufacture and deliver advanced technology solutions that address the world's most critical health and safety concerns, including maternal and fetal health, clean water...
  • Supplier Profile
    Asylum Research is the technology leader in atomic force probe microscopy (AFM) for both materials and bioscience applications.  Founded in 1999, we are dedicated to innovative...
  • Article - 17 Aug 2005
    The Nano Science and Technology Institute (NSTI) is chartered with the promotion and integration of nano and other advanced technologies through education, technology and business development.
  • Supplier Profile
    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • Supplier Profile
    Gatan, Inc. is the world's leading manufacturer of instrumentation and software used to enhance and extend the operation and performance of electron microscopes. Gatan's products, which are...
  • Supplier Profile
    CRAIC Technologies manufactures superior microspectrophotometers for science and industrial applications. We specialize in the UV, visible and NIR regions and pride ourselves in making the finest...
  • Supplier Profile
    Bruker BioAFM, former JPK Instruments AG,  is a lead­ing man­u­fac­tur­er of nano-an­a­lyt­i­cal in­stru­ments - par­tic­u­lar­ly based...
  • Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...

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