BuckyUSA is a research oriented company that is dedicated to the new exciting field of "fullerene science". The range of fullerene investigation is astounding - materials science,...
With modern techniques such as
Scanning Probe Microscopy,
Scanning Electron Microscopy, and
we are able to analyze...
Micro Photonics is the leading source of advanced instrumentation for scientific and industrial research. Thousands of clients rely on us for innovative solutions, technically superior products,...
MARC provides an infrastructure for all types of manufacturing related research by initiating and implementing research programs and agendas that optimize the many strengths that are already in...
Hysitron is the world leader in developing nanomechanical test instruments and has designed cutting edge technology for the scientific community since 1992. As the pioneers of in-situ imaging with...
Phenom™: stunning images, high throughput, ease of use
Phenom™, world’s fastest Desktop Scanning Electron Microscope takes your imaging performance to a higher level. The...
A new promising material is molybdenum-sulfur-iodine nanowires. This article is a brief overview of atomic and electronic structure of molybdenum-sulfur-iodine molecular nanowires. Basic transport,...
http://www.azonano.com/article.aspx?ArticleID=2039 | 14 Nov 2007
This article describes the use of the Nano-Scratch Tester (NST) from CSM Instruments for investigating the tribological functionality of a microsystem known as a microshutter.
http://www.azonano.com/article.aspx?ArticleID=1796 | 1 Dec 2006
The U.S. Department of Energy's
(DOE) Argonne National Laboratory has teamed with the University of Illinois
at Urbana-Champaign (UIUC), the University of Illinois at Chicago (UIC) and...
http://www.azonano.com/news.aspx?newsID=8423 | 31 Oct 2008
Tribology plays a critical role in diverse technological areas. In the advanced technological industries of semiconductor and data storage, tribological studies help optimize polishing processes and...
http://www.azonano.com/article.aspx?ArticleID=1507 | 16 Feb 2006