The Centre of Excellence in Metrology for Micro and Nano Technologies (CEMMNT) provides access to equipment and expertise to accelerate product commercialisation. This article examines Wafer Crystal...
http://www.azonano.com/article.aspx?ArticleID=2062 | 12 Feb 2008
The Centre of Excellence in Metrology for Micro and Nano
Technologies (CEMMNT) delivers comprehensive measurement,
characterisation and analytical solutions. From single measurements to
Silicon carbide (4H-SiC) is the ideal semiconductor material for power electronics.For instance, efficient power converters for electric vehicles or photovoltaic systems can be produced - as well as...
http://www.azonano.com/news.aspx?newsID=17616 | 20 May 2010
Silicon carbide is an up-and-coming semiconductor material. In a thesis project,
the qualities of the crystals and the epitaxial layers underwent precise analysis.
Another project combines the...
http://www.azonano.com/news.aspx?newsID=17588 | 19 May 2010
Oxford Instruments NanoAnalysis, a world leader in microanalysis software and systems, has announced a major release of AZtec, its solution for EDS and EBSD based analyses. This version of AZtec...
http://www.azonano.com/news.aspx?newsID=26718 | 26 Feb 2013
The atomic force microscopy was carried out using a Bruker N8 TITANOS system and showed a dense particle distribution across the sample surface. Its depth and lateral profiling provides an estimate of...
http://www.azonano.com/article.aspx?ArticleID=2592 | 11 May 2010
CSI notwithstanding, forensics experts cannot always retrieve fingerprints
from objects, but a conformal coating process developed by Penn
State professors can reveal hard-to-develop...
http://www.azonano.com/news.aspx?newsID=17473 | 11 May 2010
Hitech®, a business segment within SAFC®, a member of the Sigma-Aldrich®
Group (NASDAQ: SIAL), today underlined its commitment to Japan's microelectronics
http://www.azonano.com/news.aspx?newsID=11179 | 28 Apr 2009
The value of ceramic as a thermal barrier and for protection against corrosion
has been proven in thousands of applications over the last five decades in the
electronics industry, and in other...
http://www.azonano.com/news.aspx?newsID=7679 | 17 Sep 2008
Initially introduced as an accessory to scanning tunneling microscopy (STM), atomic force microscopy (AFM) has become an advanced and most valuable scanning probe technique broadly used in academic...
http://www.azonano.com/article.aspx?ArticleID=1533 | 10 Mar 2006