The Centre of Excellence in Metrology for Micro and Nano
Technologies (CEMMNT) delivers comprehensive measurement,
characterisation and analytical solutions. From single measurements to
The Centre of Excellence in Metrology for Micro and Nano Technologies (CEMMNT) provides access to equipment and expertise to accelerate product commercialisation. This article examines Wafer Crystal...
http://www.azonano.com/article.aspx?ArticleID=2062 | 12 Feb 2008
Silicon carbide (4H-SiC) is the ideal semiconductor material for power electronics.For instance, efficient power converters for electric vehicles or photovoltaic systems can be produced - as well as...
http://www.azonano.com/news.aspx?newsID=17616 | 20 May 2010
Silicon carbide is an up-and-coming semiconductor material. In a thesis project,
the qualities of the crystals and the epitaxial layers underwent precise analysis.
Another project combines the...
http://www.azonano.com/news.aspx?newsID=17588 | 19 May 2010
A team of researchers from the U.S. Department of Energy's Argonne National Laboratory and Ohio University have devised a powerful technique that simultaneously resolves the chemical...
http://www.azonano.com/news.aspx?newsID=31654 | 4 Dec 2014
Enhancing the electron emission of multiwall carbon nanotubes (MWCNT) is key for applications ranging from cold cathodes used in high-resolution electron microscopes to portable X-ray imaging systems....
http://www.azonano.com/news.aspx?newsID=32124 | 20 Feb 2015
Oxford Instruments NanoAnalysis, a world leader in microanalysis software and systems, has announced a major release of AZtec, its solution for EDS and EBSD based analyses. This version of AZtec...
http://www.azonano.com/news.aspx?newsID=26718 | 26 Feb 2013
This article illustrates the experimental setup for Kelvin force microscopy (KFM) and current-sensing atomic force microscopy (CS-AFM) imaging under controlled humidity using a Keysight 5500 AFM...
http://www.azonano.com/article.aspx?ArticleID=2903 | 15 Jun 2011
CSI notwithstanding, forensics experts cannot always retrieve fingerprints
from objects, but a conformal coating process developed by Penn
State professors can reveal hard-to-develop...
http://www.azonano.com/news.aspx?newsID=17473 | 11 May 2010
Hitech®, a business segment within SAFC®, a member of the Sigma-Aldrich®
Group (NASDAQ: SIAL), today underlined its commitment to Japan's microelectronics
http://www.azonano.com/news.aspx?newsID=11179 | 28 Apr 2009