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Results 1 - 10 of 19 for X-ray Topography.
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  • The Centre of Excellence in Metrology for Micro and Nano Technologies (CEMMNT) delivers comprehensive measurement, characterisation and analytical solutions. From single measurements to bespoke R&D...
  • The Centre of Excellence in Metrology for Micro and Nano Technologies (CEMMNT) provides access to equipment and expertise to accelerate product commercialisation. This article examines Wafer Crystal...
  • A team of Finnish scientists has found a new way to examine the ancient art of putting ink to paper in unprecedented 3-D detail. The technique could improve scientists' understanding of how ink...
  • Silicon carbide (4H-SiC) is the ideal semiconductor material for power electronics.For instance, efficient power converters for electric vehicles or photovoltaic systems can be produced - as well as...
  • Silicon carbide is an up-and-coming semiconductor material. In a thesis project, the qualities of the crystals and the epitaxial layers underwent precise analysis. Another project combines the...
  • A team of researchers from the U.S. Department of Energy's Argonne National Laboratory and Ohio University have devised a powerful technique that simultaneously resolves the chemical...
  • Enhancing the electron emission of multiwall carbon nanotubes (MWCNT) is key for applications ranging from cold cathodes used in high-resolution electron microscopes to portable X-ray imaging systems....
  • Oxford Instruments NanoAnalysis, a world leader in microanalysis software and systems, has announced a major release of AZtec, its solution for EDS and EBSD based analyses. This version of AZtec...
  • CSI notwithstanding, forensics experts cannot always retrieve fingerprints from objects, but a conformal coating process developed by Penn State professors can reveal hard-to-develop...
  • SAFC Hitech®, a business segment within SAFC®, a member of the Sigma-Aldrich® Group (NASDAQ: SIAL), today underlined its commitment to Japan's microelectronics industry by...
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