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NanoPhotonics provides ultra-compact defect inspection tools for wafer front side, back side and edge in R&D, automated in-line quality monitoring, and for integrated defect inspection applications in semiconductor manufacturing. Our innovative modular product architecture, advanced defect classification software and strong engineering capabilities allow us to react quickly to customer’s needs and to provide cost effective solutions. The basis of our success is both the consistent approach to the requirements of the market, and our strong customer orientation.