Hecus X-Ray Systems
PH: 43 (316-48) 11 18-17
Fax: 43 (316-48) 11 18-20
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is your experienced and dedicated partner in X-ray diffraction metrology for
nanostructure analysis in R&D, validated quality control and process analytical
XRS products include
- X-ray diffractometers for SAXS, SWAXS, GISAXS and X-Ray reflectometry,
- various non-ambient sample environments (temperature, pressure,
- a range of position sensitive X-ray detectors (1D- and 2D).
Customers benefit from our cutting-edge competence through cooperation with
leading research institutions - bridging the gap to synchrotrons - and the wide
application experience gained from our partnership with industry and academia.
Thus, Hecus XRS
customers can choose the optimal and most advanced X-ray system solutions for
their individual needs.