Bede Scientific Instruments

14 Inverness Drive East Suite H-100
CO, 80112
United States
PH: 1 (303) 790 8647
Visit Bede Scientific Instruments Website or Request Quote for Further Information

Primary Activity

Material Manufacturer

Company Background

Bede is the global leader in non-destructive X-ray metrology systems for 90nm technology nodes and below. Bede systems deliver dramatic yield enhancement through the absolute measurement of semiconductor material properties. These include not only thickness, but also measurements of structure, roughness and composition that are crucial for new materials and processes.

Bede systems incorporate one or more of the following X-ray techniques to optimize sensitivity to a given customer process:

  • High-Resolution X-ray Diffraction (HRXRD)

  • X-ray Diffraction (XRD)

  • X-ray Reflectivity (XRR)

  • X-ray Fluorescence (XRF)

  • X-ray Diffraction Imaging (XRDI)

Bede's process control solutions provide fast measurement capability on <100 micron test pads and in scribe-lines on product wafers with ScribeViewâ„¢, reducing process development costs and eliminating the need for monitor wafers.