An Introduction to a Mechanical Broadview Map Selection Tool

As the saying goes, “time is money.” Many companies take this to heart and are always seeking methods of expediting and improving various processes, to reduce the total time.

In terms of indentation testing, speed, e­fficiency and precision can be integrated into a quality control or R&D process when using one of the Nanovea Mechanical Testers. This article showcases an efficient way of saving time using the Nanovea Mechanical Tester and Broad View Map and Selection Tool software features.

Importance of Broad View Map/Selection Tool

It can be challenging to perform fast, precise and targeted indents on a surface(s) whilst also trying to obtain information from a sample with small patterned or random scattered features of interest. By using the Broad View Map and Selection Tool, the user can save time through the creation of a two-step macro recipe that maps a surface with targeted small and/or random features of interest that the user selects.

The map can then be used to perform all indents sequentially without any further user interfacing. The ability to target micro and nano-scale features could bring potential benefits to multiple industries such as jewelry, powder manufacturers, microelectronics, minerals, and MEM, as well as many others. Particles, small etched features, and grains can all be targeted using this method.

Equipment Featured

Nanovea PB1000

Multi Module Platform

3 Testing Modes in 1 (Scratch/Indent/Wear)

Loading Ranges from 0.8 uN to 400 N

XYZ Motion with 0.20 um Step Resolution

Fully Automated (Up to 100 indents in 15mins)

Integrated Imaging (Pro­lometer, AFM, Microscope)

Measurement Objectives

In the study discussed in this article, the Nanovea PB1000 Mechanical Tester was used to target ink letters on a circuit board and micro-size patterned etched features to showcase its positioning precision.

Sample on Nanovea Mechanical Tester

Sample on Nanovea Mechanical Tester

Measurement Parameters

Table 1: Test parameters use for indentations

Circuit Board Lettering Etched Features
Maximum Force (mN) 400 300
Loading Rate (mN/min) 800 600
Unloading Rate (mN/min) 800 600
Creep (s) N/A N/A
Computation Method ASTM E-2546 &
Oliver & Pharr
ASTM E-2546 &
Oliver & Pharr
Indenter Type Berkovich Berkovich

Samples Tested

Sample of Circuit Board

Sample of Circuit Board

About the Method

The Broadview Map Selection Tool requires the user to ­first locate the area of interest, map the area and then isolate the areas they want to target. The software saves each area in coordinate form in reference to your current location. The software will ask you to input the desired testing parameters for each selection, allowing the tests to be performed with recurring and/or different testing parameters.

This is particularly useful if the user needs to troubleshoot the indentation testing parameters of the application. For the circuit board shown below, Nanovea could easily target the central regions along the lettering without issue. The positioning versatility of the Broadview Map Selection Tool lets the user determine the mechanical properties of a sample at various locations of a component at random targeted locations.

Magni_ed (50x) side-by-side view of N and O ink letters on circuit board before and after mapped indentation testing

Figure 1: Magni_ed (50x) side-by-side view of N and O ink letters on circuit board before and after mapped indentation testing

Discussion

The image below is of the first step in creating a macro recipe using the Broadview Map Selection Tool and the resulting indentations. The user selects all features/areas of interest in any order, which are then automatically indented by the instrument.

Magni_ed (50x) imaged view of etched sample

Figure 2: Magni_ed (50x) imaged view of etched sample

Conclusion

This study showcased the ability of the Nanovea Mechanical Tester and the Broadview Map Selection Tool to indent specifi­c areas of interest with high-precision position control. This combination gives the user endless possibilities when targeting desired features. There is also the ability to target specific areas for quality control tests. The ease of use and reliability is clearly seen in Nanovea’s instrument.

This information has been sourced, reviewed and adapted from materials provided by Nanovea.

For more information on this source, please visit Nanovea.

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