An Overview of Mechanical Broadview Map Selection Tool for Mechanical Testers

The term ‘time is money’ is common. Many companies seek methods of expediting and improving various processes as this saves time, and therefore money. With regards to indentation testing, efficiency, precision and speed can be integrated into an R&D or quality control process, using a Nanovea Mechanical Tester.

This article demonstrates an easy way to save time using the Nanovea Mechanical Tester and Broad View Map and Selection Tool software features.

Importance of Broad View Map/Selection Tool

When a sample has small patterned, or random features of interest, it can be challenging to perform fast, precise and targeted indents on the surface. The user can save time with the Broad View Map and Selection Tool which allows them to create a two-step macro recipe.

This maps a surface containing targeted small and/or random features of interest selected by the user and then uses the map to perform all indents consecutively, without the need for further user interfacing.

Multiple industries can benefit from being able to target micro and nano-scale features, including powder manufacturers, jewelry, minerals, MEMS and microelectronics. Various features can be targets, including small etched features, grains and particles.

Equipment Featured

NANOVEA PB1000

Multi Module Platform

Loading Ranges from 0.8 uN to 400N

3 Testing Modes in 1 (Scratch/Indent/Wear)

Fully Automated (Up to 100 indents in 15 minutes)

Integrated Imaging (AFM, Profilometer, Microscope)

XYZ Motion with 0.20 µm Step Resolution

Measurement Objectives

The Nanovea PB1000 Mechanical Tester was used to target ink letters on a circuit board and micro-size patterned etched features, in order to showcase its positioning precision.

Mechanical Testing Results

Measurement Parameters

Table 1: Test parameters use for indentations

Circuit Board Lettering Etched Features
Maximum Force (mN) 400 300
Loading Rate (mN/min) 800 600
Unloading Rate (mN/min) 800 600
Creep (s) N/A N/A
Computation Method ASTM E-2546 & Oliver & Pharr ASTM E-2546 & Oliver & Pharr
Indenter Type Berkovich Berkovich

Samples Tested

Sample of Circuit Board

Sample of Circuit Board

Discussion

About the Method: When using the Broadview Map Selection Tool, the user must first identify the area of interest, map the area, and select the areas to be targeted. This area is saved by the software as a coordinate in reference to the current location. The desired testing parameters need to be input for every selection, which means that it is possible to test with recurring and/or different testing parameters. This can be useful when troubleshooting the indentation testing parameters for a specific application.

It was possible to easily target the central regions along the lettering in the circuit board below. The Broadview Map Selection Tool allows for positioning versatility which means that the user can determine the mechanical properties of a sample at various locations of a component at random target locations.

Magni_ed (50x) side-by-side view of N and O ink letters on circuit board before and after mapped indentation testing

Figure 1: Magnified (50x) side-by-side view of N and O ink letters on circuit board before and after mapped indentation testing

The software shows the first step for creating a macro recipe using the Broadview Map Selection Tool and the resulting indentations. This is demonstrated in the image below. All features/areas of interest are selected by the user and this can be done in any order. These are then automatically indented by the instrument.

Magni_ed (50x) imaged view of etched sample

Figure 2: Magnified (50x) imaged view of etched sample

Conclusion

This study demonstrates that the Nanovea Mechanical Tester can perform indents at specific areas of interest with high-precision position control from the Broadview Map Selection Tool. This tool provides endless possibilities when targeting desired features. Quality control can be tested in specific areas. The ease of use and reliability of the Nanovea Mechanical Tester is also highlighted.

This information has been sourced, reviewed and adapted from materials provided by Nanovea.

For more information on this source, please visit Nanovea.

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