The Galaxy Dual Controller for AFM

The Galaxy Dual Controller for AFM

Image Credit: CSInstruments

The GALAXY DUAL USB controller adds an array of new features to those commonly available on an existing AFM, creating exciting new opportunities for AFM users. This new controller gives new life to any AFM, improving its performance via intuitive software and new imaging modes.

The GALAXY DUAL controller offers genuine integrated lock-in, ensuring improved measurement capability including, phase detection and field measurement. The instrument is fitted with low-noise electronics while its power supply is coupled to 24-bit drive architecture, delivering smart integration and high resolution.

Compatible with Existing AFM Modes

The GALAXY DUAL USB controller has been developed with compatibility at its core. It is fully compatible with the Pico SPM (STM), Multimode, 5100, and 5500 AFM bases as well as the existing STM, AC, Phase, Contact, MFM, EFM, PFM, LFM, and EC modes.

Alongside these existing modes, the GALAXY DUAL can also accommodate the new modes below, meaning that rapid, high-definition AFM is accessible to everyone.

  • HD-KFM – This method involves no lift, resulting in much higher resolution and sensitivity
  • ResiScope & Soft ResiScope – Resistance and current, even on soft samples, from 102 to 1012 ohms
  • Soft Intermittent Contact mode – This new mode enables quantitative measurement of adhesion, stiffness, Young’s modulus, and constant force

HD-KFM mode Graphene 8 µm.

HD-KFM mode Graphene 8 µm. Image Credit: CSInstruments

ResiScope mode Dopant profiling on clived Si 2 µm.

ResiScope mode Dopant profiling on clived Si 2 µm. Image Credit: CSInstruments

Soft IC mode PS-PMMA 50 µm.

Soft IC mode PS-PMMA 50 µm. Image Credit: CSInstruments

User-Friendly Interface Design

The NanoSolution user interface is highly intuitive and extremely versatile. AFM mode selection can be used to quickly and automatically configure required electronics in a single click, while the interface’s guided workflow enables efficient, easy AFM configuration and image acquisition.

The instrument’s top view displays a view of the laser reflection on the tip, enabling straightforward laser alignment and adjustment. The side view allows an easy pre-approach with no damage to the sample or tip.

The auto setting allows the user to obtain an AFM image in just a few clicks, while the comprehensive parameters enable expert level customizations of all of the AFM’s capabilities.

User-Friendly Interface Design

Image Credit: CSInstruments

Software Designed for Everyone: Performance and Versatility

NanoSolution is a software application suitable for everyone, regardless of the user’s level of expertise or whether their AFM needs are industry-focussed or based in academic research.

The software’s ultra-fast automated mode allows even novice users to easily generate a quality image -The user simply needs to follow the workflow’s instructions and configuration process then launch the scan. Automated mode offers a range of tools, including automatic gain, approach, and tuning, as well as automated and predefined setpoints for AFM conditions.

Manual mode is also available for advanced experimentation and, while this requires increased knowledge in how to best acquire an image, it offers full control. Manual mode also offers full access to all adjustments and functions necessary, allowing experienced users to refine their results while producing high quality images suitable for rigorous analysis.

Software Designed for Everyone: Performance and Versatility

Image Credit: CSInstruments

Advanced Spectroscopy

The NanoSolution software also includes a series of unique functions specifically designed for force curve spectroscopy.

The FLEX GRID tool lets the user select a number of points of interest, which will be obtained during the scan, along with force curves at the selected coordinates. This process generates an interactive file that can be overlaid with topography or any other signal.

The FIXED STEP GRID enables the acquisition of a force curve through mapping, configured in number of points per line. The EXPERT CURVE CONTROL facilitates segment programming of the probe’s displacement in Z with parameters including duration, speed, or resolution.

These new, unique functions make NanoSolution an ideal, powerful tool for the acquisition and analysis of force curves.

Advanced Spectroscopy

Image Credit: CSInstruments

The software boasts an impressive set of specifications, including:

  • XY drive resolution: 24-bit control - 0.06 A
  • Z drive resolution: 24-bit control – 0.006 A
  • Ultra low noise HV: Typ: <0.01 mV RMS
  • 6 DAC Outputs: 6 D/A Converters (24-bit, bias, aux, and XYZ drive)
  • 8 ADC Inputs: 8 A/D Converters (16 bit)
  • Data points: up to 8192
  • Integrated lock-in: Up to 6 MHz (limited by software)
  • Second lock-in: 6 MHz (optional)
  • Interface: USB 2.0
  • Controller power: AC 100 – 240 V - 47-63 Hz
  • Operating system: Compatible Windows 10

This information has been sourced, reviewed and adapted from materials provided by CSInstruments.

For more information on this source, please visit CSInstruments.


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