Nanoscale Infrared Spectroscopy with Spatial Mapping – nanoIR2-FS

True Model Free Nanoscale IR Absorption Spectroscopy

  • 10 nm chemical imaging spatial resolution using Tapping AFM-IR
  • New high resolution, high speed and full spectra AFM-IR measurement in seconds
  • Multi-functional nanoscale property mapping modes with full featured AFM
  • Rich, high speed and interpretable IR spectra that directly correlates to FTIR
  • "Anasys engineered” for reliability and productivity

New nanoIR2-FS with FASTspectra™ Technology

The nanoIR2-FS from Anasys Instruments is the new generation of nanoscale IR spectroscopy, chemical imaging and property mapping system for both materials and life science applications.

The nanoIR2-FS is the latest generation nanoscale IR spectroscopy, chemical imaging and property mapping system for both materials and life science applications. The system provides spectroscopic capabilities that provide excellent correlation to FTIR transmission spectra on a wide range of material types, enabling nanoscale FTIR measurement.

The system also provides IR-based chemical imaging to provide mapping of chemical variations of the feature of interest. Unique Point Spectroscopy capabilities provide both spectroscopy and chemical imaging with a single source.

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Applications of AFM-IR

Chemical Analysis of Semiconductor Devices

nanoIR measurements on layers in a semiconductor device. The analysis reveals variations in chemical composition not measurable by conventional IR microscopy.

Interface Analysis of Composites

nanoIR measurements on a carbon fiber-epoxy composite revealing variations in chemical composition across the fiber/epoxy interface. This measurement was performed on a polished bulk sample.

Organic Nano Contaminant on Metal Surface

Spectra collected using the resonant enhanced mode allows identification of nanoscale organic contamination on a magnetic disk. This particle has dimensions of approximately 100 nm x 200 nm x 28 nm.

Microtomed Toner Particle

Toner particles are a complex mixture of multiple components, the nanoIR allows identification and localization of these components with nanoscale resolution.

Hydrocarbons in Minerals

AFM topography (L) and IR absorption image (R) showing the location of hydrocarbons as detected by the CH stretch absorption.

Thin Polymer Films

The resonance enhanced mode enables high quality measurements on very thin films. A 20 nm film on PMMA taken by the nanoIR.

Correlated Property Mapping with Nanoscale Topographical, Chemical, Mechanical, Electrical and Thermal Analysis Capabilities

Versatile, Full Featured AFM

Each product in the Anasys Instruments family is developed around the company’s full featured AFM supporting many routinely used AFM imaging modes. These include CAFM, EFM, MFM, force modulation, force curves, lateral force, contact, phase, tapping and more.

Tapping image of block copolymer.

Force modulation of polymer blend.

KPFM Image on Nanocomposite sample composed of graphene oxide and polymeric material.

Tapping phase image of polymer nanocomposite.

Mechanical Spectroscopy and Imaging

Broadband nanomechanical spectra, which utilize Lorentz Contact Resonance (LCR), provide valuable information about variations in material stiffness, friction and viscosity. LCR provides sensitive material contrast on materials that range from soft polymers to hard inorganics and semiconductors.

Nanomechanical spectra (left) discriminate materials on the basis of stiffness and damping. Examples of LCR stiffness maps on complex polymer blends (center) and high performance paper products (right).

Nanoscale Thermal Analysis (nanoTA)

This award-winning technology, developed by Anasys Instruments, uses Anasys ThermaLever™ probes to locally increase the temperature of the sample to map and measure thermal transitions and other thermal properties.

Left: nanoTA uses a heated AFM tip to measure glass transition and melt temperatures with nanoscale spatial resolution. Middle: Thermal transition curves on a 21 layer laminated polymer film. Right: Scanning thermal microscopy visualizes variations in temperature and thermal conductivity on a sectioned circuit board.

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