Automated Atomic Force Microscope (AFM) with Integrated Optical Microscopy - NT-MDT NEXT

NT-MDT’s NEXT is a user-friendly atomic force microscope that allows many AFM and STM capabilities and delivers superior performance. The instrument provides motorized sample positioning, high-resolution optical microscope positioning, and motorized zoom and focusing of the optical microscope.

Furthermore, the Nova PX software algorithms eliminate the gap between AFM and optics and deliver nonstop zoom from large optical view to atomic resolution. Combined with the PX Ultra controller, NEXT offers a broad range of STM and AFM techniques for both beginners and advanced users.

With its broad range of techniques and modes of probe measurements, NEXT is ideal for many applications in technology and science.

Key Features

  • Routine atomic resolution
  • Outstanding automation level
  • 60+ SPM modes in basic configuration
  • Curves analysis
  • Quick scanner with XYZ low-noise close-loop
  • Combined with atomic force microscopy method HybriD Mode
  • Continuous zoom from millimeter to nanometer range
  • Excellent noise floor and thermal drifts
  • Easy-to-use and flexible software
  • Topography measurements
  • Advanced control electronics

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