SOLVER Nano - Affordable and Robust Atomic Force Microscope for Research and Educational Use

NT-MDT's SOLVER Nano atomic force microscope (AFM) is specifically designed for research and education purposes.

AFM is utilized as a standard analytical tool for the characterization of physical properties with high spatial resolution down to the atomic level. The SOLVER Nano is suitable for researchers who need a low-cost, rugged, and easy-to-use professional instrument.

The instrument is fitted with a 100 micron closed loop XYZ peizotube scanner with low-noise capacitance sensors. When compared to optical or strain gauge sensors, capacitance sensors have greater speed in the feedback signal. These capabilities allow all the primary AFM methods in a compact SPM design.

The SOLVER Nano can be used for studying carbon materials, polymers and bio objects.

Key Features

The main features of the SOLVER Nano AFM are:

  • Rugged and low-cost
  • Easy-to-use professional tool
  • Allows characterization of physical properties with high spatial resolution down to atomic level
  • Equipped with professional 100 micron CL peizotube scanner with low-noise capacitance sensors
  • Suitable for research and education purposes
  • Range of accessories available

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