PerkinElmer offers the new
NexION spectrometer that enables users to quickly and accurately measure and characterize nanoparticles. ® 350 ICP-MS
The system has 10 times faster data acquisition speed compared to other ICP-MS available on the market.
NexION provides increased productivity and uptime through a range of exclusive features designed to improve signal stability. ® 350 ICP-MS
It uses PerkinElmer’s Syngistix™ workflow-based software, which features an intuitive interface and novel automatic method setup tools for rapid implementation.
In addition, the optional Nano Application Module in the software can be integrated with the spectrometer for exceptional detection and characterization of nanomaterials.
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An Overview of the NexION ® 350 ICP-MS Single Particle Analyzer
NexION combines a variety of technical innovations that enhance signal stability, reduce maintenance needs and downtime, lower background and interferences, and produce better results. ® 350 ICP-MS
It is available in four different models to suit specific application requirements.
The main features of the
NexION spectrometers are as follows: ® 350 ICP-MS
High speed data acquisition
Simultaneous dual mode detector
Includes large, easily accessible area for sample introduction
Low liquid uptake nebulizer
Free-running RF plasma generator
Universal Cell Technology with three modes of operation: Standard, Collision or Reaction
Custom-designed, four-stage vacuum system
Full color plasma view
Fully automatic X, Y, Z torch positioning
Triple Cone Interface creates the most tightly focused ion beam in the industry and reduces sample build-up on internal components
Quadrupole Ion Deflector changes positively charged ions 90° into the Universal Cell and filters off neutrals
Unique steel alloy Quadrupole for unparalleled stability
Requires no extraction lenses for cleaning
Simple operation through PerkinElmer’s Syngistix™ workflow-based software
Benchtop design with no rear connections
Listed below are just a few of the many applications which the
NexION can be used for: ® 350 ICP-MS
Silver nanoparticles (AgNPs) are the most widely used nanoparticles in consumer products, thanks to their antimicrobial properties. The small size and high surface area of AgNPs increase their efficacy as an antimicrobial through high reaction rates.
SP-ICP-MS is the ideal technique for ENP analysis due to its ability to provide data regarding particle size, count, and mass distributions at significant concentrations and can determine all three nano-specific parameters from a single sample.
Today, nanoparticles are being utilized in a wide variety of products and materials, such as clothing, coatings, fuel additives, etc., thus characterizing nanoparticles is very important.
In the semiconductor and nanoelectronics fabrication industry, the chemical-mechanical planarization (CMP) process is used for smoothing semiconductor surfaces for photolithography using chemical and mechanical forces.
Nowadays, CMP slurries containing nanoparticles are used for miniaturization of electronic devices and improvement of productivity.
Over the last 10 years, there has been a significant increase in the production and application of engineered nanomaterials which has increased the possibility of release into surroundings.