The M1 MISTRAL is a spectrometer with a small footprint used to study bulk materials and layers using X-ray fluorescence technology. There is no need for sample preparation and non-destructive measurements on a wide range of sample sizes are possible. Jewellery, electronics and RoHS are common application areas.
Highly accurate Micro-XRF analysis of bulk layers and materials can be carried out using this instrument. It is possible to study all elements from Z=22 and above.
Specimens up to 100mm x 100mm x 100 mm in size can be directly positioned on the sample stage and studied without any further preparation. As measurement is contactless, it can be conveniently performed on arbitrarily shaped specimens such as finely wrought jewellery or materials of complex and uneven shape.
The key features of the M1 MISTRAL include:
- The micro focus X-ray tubes of the M1 MISTRAL provide enough intensity for spot sizes even as small as 100µm, depending on the collimator used.
- The instrument is provided with the XSpect analysis software that offers standardless or standard-based quantification for layer systems and bulk materials.
- The M1 MISTRAL is available with two different X-ray detectors, either a large area gas-filled proportional counter for standard applications in quality control or a silicon drift detector with superior count rate performance and energy resolution, to drive detection limits down to 0.01wt.%.
- These detectors, digital pulse processing and optimized geometrical conditions enable maximum efficiency in X-ray detection and therefore fast and accurate analysis results.
- Using the video microscope for precise sample positioning, it is ensured that measurement takes place at the desired spot.
- Functionality can be added with optional computer-controlled stage motorization and auto-focus function
The M1 MISTRAL is used in a wide range of applications, including:
- Jewellery and alloy analysis – The M1 MISTRAL is suitable for examining all jewellery, precious metal alloys and coins. The exact composition of all jewellery alloys, silver or platinum group metals can be determined within a fraction of a minute. Trace elements in light matrices can also be detected, e.g. as required by RoHS. This enables direct control of hazardous element concentrations in electric and electronic devices.
- Characterization of coatings – The X-ray fluorescence technology used by the M1 MISTRAL supports effective analysis of thin coatings such as on metals, plastics or PCBs.