The remarkably compact
Keysight 8500B field-emission scanning electron microscope (FE-SEM) has been optimized for low-voltage imaging, extremely high surface contrast, and resolution.
This innovative, technologically advanced system also offers fully integrated energy dispersive spectroscopy (EDS) capabilities, allowing quantitative elemental analysis to be performed on arbitrary points, on a continuous line scan, or in a user-defined regional map. It can detect elements as light as carbon, up to americium.
Keysight’s patented event-streamed spectrum imaging saves the full spectrum at every pixel for analysis and display. Dynamic element mapping allows real-time selection or editing of elements and processing parameters during spectrum image collection.
Keysight’s patented technology employed in the
8500B FE-SEM embodies the successful miniaturization of the core technology in conventional scanning electron microscopes. The electrostatic lens design delivers consistent, repeatable performance without constant retuning due to hysteresis effects in the magnetic lenses in conventional SEMs.
With multiple imaging techniques for improving surface contrast and increasing depth of field, the
8500B FE-SEM allows nanoscale features to be observed on a wide variety of nanostructured materials, including polymers, thin films, biomaterials, and other energy- sensitive samples on any substrate, even glass.
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8500B FE-SEM Images
Foraminifera shell. Courtesy of Scott Fay, Robert Sanders, and Joel Sheffield, Temple University.
Diatom skeleton in ancient coral reef. Courtesy of Chloe Glynn.
Uncoated BSE Image of Insect head.
BSE Image of MEMs device.
Vitreous Cells. Courtesy of Temple University.
Aligned ZnO Nanowires. Courtesy of US Naval Research Laboratory.