Scios™ DualBeam™ with Advanced Detection Technology from FEI

FEI Scios™ delivers outstanding 2D and 3D performance for a broad range of samples at excellent contrast. With innovative features designed to increase throughput, precision, and ease of use, the FEI Scios is ideal for advanced research and analysis across academic, government, and industrial research environments.

Advanced detection technology is at the very core of the FEI Scios. In-lens FEI Trinity™ detection technology collects all signals simultaneously, saving time and offering distinctly different contrasts to capture the maximum amount of data.

An innovative, under-the-lens concentric backscatter detector enhances efficiency, enabling you to select a signal based on its angular distribution to easily separate materials and topographic contrast-even at 20 eV landing energy.

Key benefits for Materials Science

  • Excellent contrast paired with high acquisition speeds and high resolution at low kV
  • Flexible detection schemes for simultaneous acquisition of all relevant information
  • Instant productivity for all operators with unique user guidance and advanced automation
  • Workflow solutions for increased productivity: Amira Analysis wizard, CLEM targeted AS&V and CryoTEM sample preparation

Key benefits for Life Sciences

To better understand cellular functions in a complex 3-D context, volume microscopy at high resolution is a key application. However, most of the existing methods are time consuming and cumbersome with lengthy sample preparation procedures to target precisely the region of interest before data collection and volume reconstruction can be done. Achieving optimal contrast can also be challenging in volume imaging schemes for automatic data analysis and reconstruction.

Scios, with its unique and flexible detection scheme, offers simultaneous detection of all information with excellent contrast at high acquisition speeds and high resolution at low kV. Thus, it is ideal for imaging a wide range of samples including very sensitive materials. Fully automated column alignments limit the need for highly trained operators while predefined use cases for common conditions gives instant productivity to everyone, especially relevant to multi-user facilities.

With efficient and value adding workflows, Scios enables results in the shortest possible time with great accuracy. The Amira SDB wizard streamlines the steps necessary for accurate analysis and visualization of 3D data sets acquired on Scios. CLEM (Correlative Light and Electron Microscopy) targeted AutoSlice & View provides a true workflow solution in finding the precise location of the region of interest in a large volume for high resolution imaging and simplified high precision cryo-TEM sample prep offers highest yield without contamination even for challenging samples.

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